Development of SiPM batch aging and performance measurement system

Chuqi YI; Jifeng HAN; Yangmei CHEN; Peng HU; Junhan HE; Yiyang LONG; Xingquan LIU; Weiping LIN; Guofeng QU; Sen QIAN; Peipei REN; Jing REN; Ruiqiang SONG; Penghui WANG; Ke WANG; Na WANG; Zhigang WANG; Ci WANG; Jiao WANG; Shenghua YIN; Chaoyang ZHAO

doi:10.11889/j.0253-3219.2025.hjs.48.240262

NUCLEAR TECHNIQUES, Volume. 48, Issue 3, 030402(2025)

Development of SiPM batch aging and performance measurement system

Chuqi YI¹, Jifeng HAN^1、*, Yangmei CHEN¹, Peng HU², Junhan HE¹, Yiyang LONG¹, Xingquan LIU¹, Weiping LIN¹, Guofeng QU¹, Sen QIAN³, Peipei REN¹, Jing REN⁴, Ruiqiang SONG^1,3, Penghui WANG¹, Ke WANG³, Na WANG³, Zhigang WANG³, Ci WANG⁴, Jiao WANG⁵, Shenghua YIN², and Chaoyang ZHAO¹

Author Affiliations

¹Key Laboratory of Radiation Physics and Technology of Ministry of Education, Institute of Nuclear Science and Technology, Sichuan University, Chengdu 610064, China

²(China National Nuclear Corporation (Beijing) Nuclear Instruments Co. Ltd., Beijing 100176, China)

³Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China

⁴College of Physics and Optoelectronic Engineering, Harbin Engineering University, Harbin 150001, China

⁵Sichuan Vocational and Technical College of Communications, Chengdu 611130, China

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References(28)

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Chuqi YI, Jifeng HAN, Yangmei CHEN, Peng HU, Junhan HE, Yiyang LONG, Xingquan LIU, Weiping LIN, Guofeng QU, Sen QIAN, Peipei REN, Jing REN, Ruiqiang SONG, Penghui WANG, Ke WANG, Na WANG, Zhigang WANG, Ci WANG, Jiao WANG, Shenghua YIN, Chaoyang ZHAO. Development of SiPM batch aging and performance measurement system[J]. NUCLEAR TECHNIQUES, 2025, 48(3): 030402

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Paper Information

Category: NUCLEAR ELECTRONICS AND INSTRUMENTATION

Received: Jun. 26, 2024

Accepted: --

Published Online: Apr. 15, 2025

The Author Email: Jifeng HAN (韩纪锋)

DOI:10.11889/j.0253-3219.2025.hjs.48.240262

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology