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Journal of Infrared and Millimeter Waves, Volume. 26, Issue 1, 10(2007)

TECHNIQUES OF OPTICAL MICROSCAN IN STARING INFRARED IMAGING SYSTEM

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    [1] [1] Joseph C Gillette,Thomas M Stadtmiller.Aliasing reduction in staring infrared imagers utilizing subpixel techniques[J],Opt.Eng.1995,34:3130-3137.

    [2] [2] Cabanski W,Breiter R,Mauk K-H,et al.Miniaturized high performance starring thermal imaging system[J],Proc.SPIE,2000,4028:208-219.

    [3] [3] Jean Fortin,Paul Chevrette.Realization of a fast microscanning device for infrared focal plane arrays[J],Proc.SPIE,1996,2743:185-196.

    [4] [4] Edward A Watson,Robert A Muse,Fred P Blommel.Aliasing and blurring in microscanned imagery[J],Proc.SPIE,1992,1689:242-250.

    [5] [5] John Lester Miller,John Wilste.Benefits of microscan for staring infrared imagers[J].Proc.SPIE,2004,5407:127-138.

    [6] [6] Bergeron A,Jerominek H.Dual-band dual field-of-view TVWS prototype[J].Proc.SPIE,2006,6206:62061O\1-62061O\9.

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    [4] Bai Junqi, Chen Qian, Wang Xianya. An Improved High-Resolution Reconstruction Algorithm for Staring Infrared Image[J]. Acta Optica Sinica, 2010, 30(1): 86

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    [7] Zhang Liang, Qiu Zhen′an, Yang Xiaoru, Liu Yu. Research of Infrared Micro-Scanning Technology[J]. Laser & Optoelectronics Progress, 2012, 49(4): 42302

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    [in Chinese], [in Chinese]. TECHNIQUES OF OPTICAL MICROSCAN IN STARING INFRARED IMAGING SYSTEM[J]. Journal of Infrared and Millimeter Waves, 2007, 26(1): 10

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    Paper Information

    Received: Mar. 30, 2006

    Accepted: --

    Published Online: Aug. 17, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology