Acta Optica Sinica, Volume. 8, Issue 7, 631(1988)
Measurements of thin film parameters by quasi-symmetric waveguide method
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WANG YUMING. Measurements of thin film parameters by quasi-symmetric waveguide method[J]. Acta Optica Sinica, 1988, 8(7): 631
Paper Information
Category: Instrumentation, Measurement and Metrology
Received: Dec. 15, 1986
Accepted: --
Published Online: Sep. 16, 2011
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CSTR:32186.14.
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