Electrical Aging Test and Lifetime Analysis of Whispering-Gallery-Mode Micro-Cavity Lasers

Yingrun Fan; Jinlong Xiao; Yuede Yang; Youzeng Hao; Yongtao Huang; Yongzhen Huang

doi:10.3788/CJL202249.0601001

Chinese Journal of Lasers, Volume. 49, Issue 6, 0601001(2022)

Electrical Aging Test and Lifetime Analysis of Whispering-Gallery-Mode Micro-Cavity Lasers

Yingrun Fan^1,2, Jinlong Xiao^2,3、*, Yuede Yang^2,3, Youzeng Hao^2,3, Yongtao Huang^2,3, and Yongzhen Huang^1,2,3

Author Affiliations

¹School of Microelectronics, University of Chinese Academy of Sciences, Beijing 100049, China

²State Key Laboratory of Integrated Optoelectronics, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China

³Center of Materials Science and Optoelectronics Engineering, University of Chinese Academy of Sciences, Beijing 100049, China

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Yingrun Fan, Jinlong Xiao, Yuede Yang, Youzeng Hao, Yongtao Huang, Yongzhen Huang. Electrical Aging Test and Lifetime Analysis of Whispering-Gallery-Mode Micro-Cavity Lasers[J]. Chinese Journal of Lasers, 2022, 49(6): 0601001

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Paper Information

Category: laser devices and laser physics

Received: Jun. 8, 2021

Accepted: Aug. 17, 2021

Published Online: Mar. 2, 2022

The Author Email: Jinlong Xiao (jlxiao@semi.ac.cn)

DOI:10.3788/CJL202249.0601001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology