Opto-Electronic Engineering, Volume. 35, Issue 9, 55(2008)
Thickness Measurement of Ultra-thin Metallic Foil with Tandem Differential White Light Interferometry
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DU Yan-li, YAN Hui-min. Thickness Measurement of Ultra-thin Metallic Foil with Tandem Differential White Light Interferometry[J]. Opto-Electronic Engineering, 2008, 35(9): 55
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Received: Dec. 25, 2007
Accepted: --
Published Online: Mar. 1, 2010
The Author Email: Yan-li DU (duyanli@zzu.edu.cn)
CSTR:32186.14.
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