DISCRIMINATION YEARS OF ROUGH RICE BY USING VISIBLE/NEAR INFRARED SPECTROSCOPY BASED ON INDEPENDENT COMPONENT ANALYSIS AND BP NEURAL NETWORK

[in Chinese]; [in Chinese]; [in Chinese]

Journal of Infrared and Millimeter Waves, Volume. 26, Issue 6, 433(2007)

[in Chinese], [in Chinese], and [in Chinese]

Author Affiliations

[in Chinese]

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References(5)

[3] [3] Kwon Y K,Cho R K.Identification of rice variety using near infrared spectroscopy[J].Journal of Near Infrared Spectroscope,1998,6:67-73.

[4] [4] Hyvarinen A.Sparse code shrinkage:Denoising of nongaussian data by maximum likelihood estimation[J].Neural Computation,1999,11 (7):1739-1768.

[5] [5] Hoyer P O,Hyv rinen A.Independent component analysis applied to feature extraction from colour and stereo images[J].Network:Computation in Neural Systems,2000,11(3):191-210.

[6] [6] Hyv rinen A,Hoyer P O.Emergence of phase and shift invariant features by decomposition of natural images into independent feature subspaces[J].Neural Computation,2000,12 (7):1705-1720.

[10] [10] Osborne B G,Fearn T.Near Infrared Spectroscopy in Food Analysis[J].Longman Scientific and Technical,Essex,U.K.,1986.

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[1] Chen Xiaofeng, Long Changjiang, Niu Zhiyou, Zhu Kai. Classification Research of Chinese Medicine Based on Latent Semantic Analysis and NIR[J]. Acta Optica Sinica, 2014, 34(9): 930001

[2] Liu Fei, Feng Lei, Chai Rongyao, Sun Guangming, Lou Binggan, Sun Ce, He Yong. Discrimination of Rice Canopy Leaf Blast Based on Spectroscopic Techniques and Direct Orthogonal Signal Correction[J]. Acta Optica Sinica, 2010, 30(2): 585

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[in Chinese], [in Chinese], [in Chinese]. DISCRIMINATION YEARS OF ROUGH RICE BY USING VISIBLE/NEAR INFRARED SPECTROSCOPY BASED ON INDEPENDENT COMPONENT ANALYSIS AND BP NEURAL NETWORK[J]. Journal of Infrared and Millimeter Waves, 2007, 26(6): 433

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Paper Information

Received: Nov. 27, 2006

Accepted: --

Published Online: Aug. 17, 2008

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Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology