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Chinese Optics Letters, Volume. 17, Issue 12, 121103(2019)

Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging

Zhiyuan Gu, Xianghui Wang*, Jianxin Wang, Fei Fan, and Shengjiang Chang
Author Affiliations
  • Institute of Modern Optics, Tianjin Key Laboratory of Optoelectronic Sensor and Sensing Network Technology, Nankai University, Tianjin 300350, China
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    Zhiyuan Gu, Xianghui Wang, Jianxin Wang, Fei Fan, Shengjiang Chang, "Sidelobe suppression and axial resolution enhancement in 4pi microscopy with higher-order radially polarized Laguerre–Gaussian beams using subtractive imaging," Chin. Opt. Lett. 17, 121103 (2019)

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    Paper Information

    Category: Imaging Systems

    Received: Jun. 17, 2019

    Accepted: Aug. 22, 2019

    Published Online: Dec. 3, 2019

    The Author Email: Xianghui Wang (wangxianghui@nankai.edu.cn)

    DOI:10.3788/COL201917.121103

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology