[1] [1] Fine K R, Garbe R, Gip T, et al. Non-destructive real-time direct measurement of subsurface damage［C］. SPIE, 2005, 5799: 105-110.

[2] [2] Wang Zhuo. Study on the detection and control techniques of subsurface damage in optical fabrication［D］. Changsha: National University of Defense Technology, 2008.

[3] [3] Deng Yan, Xu Qiao, Chai Liqun, et al. Total internal reflection microscopy: a subsurface defects identification technique in optically transparent components［J］. Hign Power Laser and Particle Beams, 2009, 21(6): 835-840.

[4] [4] Li Gailin. Theoretical and experimental research on the measurement of grinding subsurface damages for optical materials［D］. Changsha: National University of Defense Technology, 2006.

[5] [5] Liu Jian, Ma Zhanlong, Wang Junlin. Research status of subsurface damage detection technology of optical elements［J］. Laser & Optoelectronics Progress, 2011, 48(8): 081204.

[6] [6] Tian Ailin, Wang Hui, Wang Chunhui. Simulation research on the light-scattering properties of the subsurface damage of optical components［J］. Chinses J Lasers, 2013, 40(9): 090806.

[7] [7] Cui Hui, Liu Shijie, Zhao Yuanan, et al. Study on total internal reflection microscopy for subsurface damage［J］. Acta Optica Sinica, 2014, 34(6): 0612004.

[8] [8] Yu Daoyin, Tan Hengying. Engineering optics［M］. Beijing: China Machine Press, 2011: 294-298.