Chinese Journal of Liquid Crystals and Displays, Volume. 36, Issue 10, 1395(2021)

Mura defect detection based on effective background reconstruction and contrast enhancement

HU Liang1,2, HU Xue-juan1,2,3, HUANG Zhen-hong1,2, XU Lu1,2, HU Kai1,2, and ZHANG Jia-ming1,2
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    References(12)

    [2] [2] CEN Y G, ZHAO R Z, CEN L H, et al. Defect inspection for TFT-LCD images based on the low-rank matrix reconstruction [J]. Neurocomputing, 2015, 149: 1206-1215.

    [7] [7] TSAI D M, TSENG Y H, CHIU W Y. Surface defect detection in low-contrast images using basis image representation [C]//2015 14th IAPR International Conference on Machine Vision Applications (MVA). Tokyo: IEEE, 2015: 186-189.

    [8] [8] WANG X, DONG R, LI B. TFT-LCD Mura defect detection based on ICA and multi-channels fusion [C]//2016 3rd International Conference on Information Science and Control Engineering (ICISCE). Beijing: IEEE, 2016: 687-691.

    [9] [9] CHEN L C, KUO C C. Automatic TFT-LCD Mura defect inspection using discrete cosine transform-based background filtering and 'just noticeable difference' quantification strategies [J]. Measurement Science and Technology, 2007, 19(1): 015507.

    [10] [10] JIN S Q, JI C, YAN C C, et al. TFT-LCD Mura defect detection using DCT and the dual-γ piecewise exponential transform [J]. Precision Engineering, 2018, 54: 371-378.

    [11] [11] PARK J S, LEE S H. Automatic Mura detection for display film using mask filtering in wavelet transform [J]. IEICE Transactions on Information and Systems, 2015, E98-D(3): 737-740.

    [12] [12] FAN S K S, CHUANG YC. Automatic detection of Mura defect in TFT-LCD based on regression diagnostics [J]. Pattern Recognition Letters, 2010, 31(15): 2397-2404.

    [13] [13] MA Z Q, GONG J. An automatic detection method of Mura defects for liquid crystal display [C]//2019 Chinese Control Conference (CCC). Guangzhou: IEEE, 2019: 7722-7727.

    [16] [16] LEE J. Region-based machine learning for OLED Mura defects detection [J]. SID Symposium Digest of Technical Papers, 2021, 52(1): 200-203.

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    HU Liang, HU Xue-juan, HUANG Zhen-hong, XU Lu, HU Kai, ZHANG Jia-ming. Mura defect detection based on effective background reconstruction and contrast enhancement[J]. Chinese Journal of Liquid Crystals and Displays, 2021, 36(10): 1395

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    Paper Information

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    Received: Jul. 5, 2021

    Accepted: --

    Published Online: Nov. 6, 2021

    The Author Email:

    DOI:10.37188/cjlcd.2021-0177

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