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Semiconductor Optoelectronics, Volume. 46, Issue 1, 83(2025)

Fluorescence Microscopic Imaging Based on Super-Rayleigh Speckle Modulation

ZHANG Kefan1,2 and WANG Zhongyang1,2
Author Affiliations
  • 1Shanghai Advanced Research Institute, Chinese Academy of Sciences, Shanghai 201210, CHN
  • 2University of Chinese Academy of Sciences, Beijing 100049, CHN
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    ZHANG Kefan, WANG Zhongyang. Fluorescence Microscopic Imaging Based on Super-Rayleigh Speckle Modulation[J]. Semiconductor Optoelectronics, 2025, 46(1): 83

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    Paper Information

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    Received: Dec. 10, 2024

    Accepted: Sep. 18, 2025

    Published Online: Sep. 18, 2025

    The Author Email:

    DOI:10.16818/j.issn1001-5868.20241221001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology