Photonics Research, Volume. 4, Issue 2, 0093(2016)
Stochastic collocation for device-level variability analysis in integrated photonics
Fig. 1. Upper plot shows the perspective view of a symmetric DC. Red arrows present the flow of light. Part of the light is coupled from bottom waveguide to the above one. Cross section is amplified in the lower plot. The mean width and thickness of the DC are
Fig. 2. 2D contour plot of field coupling coefficient versus waveguide width and thickness.
Fig. 4. Top: the red exes
Fig. 5. Sampling points used to perform the MC analysis through direct Fimmwave simulations for the correlated random variables
Fig. 6. Blue circles
Fig. 7. PDF and CDF of the coupling coefficient for
Fig. 8. PDF and CDF of the 3 dB-coupling length for
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Yufei Xing, Domenico Spina, Ang Li, Tom Dhaene, Wim Bogaerts, "Stochastic collocation for device-level variability analysis in integrated photonics," Photonics Res. 4, 0093 (2016)
Received: Oct. 14, 2015
Accepted: Jan. 26, 2016
Published Online: Sep. 28, 2016
The Author Email: Wim Bogaerts (wim.bogaerts@ugent.be)