Fig. 1. Diagram of APD test in linear mode

Fig. 2. Diagram of experimental device

Fig. 3. Three signal waveforms

Fig. 4. Diagram of time jitter test

Fig. 5. Data acquired from TCSPC

Fig. 6. (a) Photon detection efficiency, (b) afterpulse probability, and (c) dark count rate and bias voltage for a gated signal amplitude of 10 V and an operating temperature of –10℃

Fig. 7. (a) Afterpulse probability and (b) dark count rate as a function of photon detection efficiency at different temperatures

Fig. 8. (a) Afterpulse probability and (b) dark count rate as a function of photon detection efficiency at different gate signal amplitudes