Chinese Journal of Lasers, Volume. 51, Issue 13, 1304009(2024)
High Power Laser Synchronous Measurement Technology at the Target
Fig. 2. Relation between scattering efficiency and angle θ of incident light and collection cone
Fig. 4. Track data of the scattered light. (a) Track data of the scattered light received by the photomultiplier before adding a 351 nm bandpass filter; (b) track data of the scattered light received by the photomultiplier after adding a 351 nm bandpass filter
Fig. 6. Online synchronous test experiment schematic diagram of Shenguang-II facility
Fig. 7. Track data of the first infrared reference light and ultraviolet signal light obtained by the oscilloscope
Fig. 8. Fitting results. (a)The blue asterisk are the points selected by the infrared reference light higher than the oscilloscope reading noise, and the red curve is the result of its fitting; (b) the blue asterisk are the points above the oscilloscope reading noise selected by the ultraviolet signal light, and the red curve is the result of its fitting
Fig. 9. Test results of eight pulses of delay between the first signal light to be measured and the reference light
Fig. 10. Final time synchronization test results of the four-way signal beam and the reference beam
Fig. 11. Off-line scattering sphere and oscilloscope dual-channel jitter test optical path diagram
Fig. 12. The relationship between the infrared scattering efficiency and the angle θ of the incident light and the collection cone measured by off-line scattering sphere
Fig. 13. Track data of jitter between the test beams under dual-channel when the scattering sphere was used
Fig. 14. Off-line non-scattering sphere using oscilloscope dual-channel jitter test optical path diagram
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Tianyu Zhang, Wei Fan, Xiaochao Wang, Lin Yang, Neng Hua, Guoyang Li, Xiuqing Jiang, Yajing Guo, Panzheng Zhang, Zhiyong Xie, Mingying Sun, Shengjia Zhang, Tao Wang, Jiaju Song, Kan Gu. High Power Laser Synchronous Measurement Technology at the Target[J]. Chinese Journal of Lasers, 2024, 51(13): 1304009
Category: Measurement and metrology
Received: Dec. 12, 2023
Accepted: Feb. 6, 2024
Published Online: Jul. 2, 2024
The Author Email: Wei Fan (fanweil@siom.ac.cn)
CSTR:32183.14.CJL231516