Opto-Electronic Engineering, Volume. 40, Issue 4, 38(2013)

Absolute Distance Measurement with Multi-wavelength Interferometric Method of Compensating for the Refractive Index of Air

HUA Qing1,2、*, ZHOU Weihu1, and JI Rongyi1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(14)

    [1] [1] JIN Guofan, LI Jingzhen. Laser Metrology [M]. Beijing: Science Press, 1998: 631-642.

    [2] [2] YIN Chunyong. Modern Interferometric Measuring Technique [M]. Tianjin: Tianjin University Press, 1999: 193-200.

    [3] [3] Hirokazu Matsumoto, Tokuyuki Honda. High-accuracy length-measuring interferometer using the two-colour method of compensating for the refractive index of air [J]. Meas. Sci. Technol (S0028-0836), 1992, 3: 1084-1086.

    [4] [4] ZENG Lijiang, Souichi Telada, Katuo Seta, et al. A weight average method to improve the uncertainty of length measurement in a two-color interferometer [J]. Optics Communications (S0030-4018), 2001, 187: 295-299.

    [5] [5] Konstantinos Falaggis, David P Towers, Catherine E Towers. Method of excess fractions with application to absolute distance metrology: theoretical analysis [J]. Appl. Opt(S003-6935), 2011, 50(28): 5484-5497.

    [6] [6] LI Tianchu. Limits on the Relative Uncertainty of Measuring Physical Length by Means of Optical Interferometry [J]. Acta Metrologica Sinica, 1999, 20(1): 31-42.

    [7] [7] LIANG Jing. Research on Multi-wavelength Interferometer with 633nm Band He-Ne Laser for Absolute Distance Measurement [D]. Changsha: National University of Defense Technology, 2010: 84-89.

    [8] [8] Kaoru Minoshima, Hirokazu Matsumoto. High-accuracy measurement of 240-m distance in an optical tunnel by use of a compact femtosecond laser [J]. Appl. Opt (S003-6935), 2000, 39(30): 5512-5517.

    [9] [9] Peter L Bender, James C Owens. Correction of Optical Distance Measurements for the Fluctuating Atmospheric Index of Refraction [J]. J. Geophys. Res(S0148-0227), 1965, 70(10): 2461-2462.

    [10] [10] Jennifer E Decker, John R Miles, Alan A Madej, et al. Increasing the range of unambiguity in step-height measurement with multiple-wavelength interferometry-application to absolute long gauge block measurement [J]. Appl. Opt(S003-6935), 2003, 42(28): 5670-5678.

    [11] [11] Konstantinos Falaggis, David P Towers, Catherine E Towers. Multiwavelength interferometry: extended rage metrology [J]. Opt. Lett (S0146-9592), 2009, 34(7): 950-952.

    [12] [12] Catherine E Towers, David P Towers, Julian D C Jones. Optimum frequency selection in multifrequency interferometry [J]. Opt. Lett (S0146-9592), 2003, 28(11): 887-889.

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    HUA Qing, ZHOU Weihu, JI Rongyi. Absolute Distance Measurement with Multi-wavelength Interferometric Method of Compensating for the Refractive Index of Air[J]. Opto-Electronic Engineering, 2013, 40(4): 38

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    Paper Information

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    Received: Nov. 19, 2012

    Accepted: --

    Published Online: May. 24, 2013

    The Author Email: Qing HUA (huaqing0601@126.com)

    DOI:10.3969/j.issn.1003-501x.2013.04.006

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