Chinese Journal of Liquid Crystals and Displays, Volume. 35, Issue 12, 1315(2020)

Detection of reflective surface defects based on phase measuring deflectometry

TAO Qian, ZHOU Zhi-feng, WU Ming-hui, and WANG Li-rui
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    References(6)

    [2] [2] KNAUER M C, KAMINSKI J, HAUSLER G. Phase measuring deflectometry: a new approach to measure specular free-form surfaces [C]//Proceedings Volume 5457, Optical Metrology in Production Engineering.Strasbourg: SPIE, 2004: 366-376.

    [8] [8] XU Y J, GAO F, JIANG X Q. Performance analysis and evaluation of geometric parameters in stereo deflectometry [J]. Engineering, 2018, 4(6): 806-815.

    [9] [9] HUANG L,IDIR M, ZUO C, et al. Review of phase measuring deflectometry [J]. Optics and Lasers in Engineering, 2018, 107: 247-257.

    [11] [11] GHIGLIA D C, PRITT M D.Two-dimensional Phase Unwrapping: Theory, Algorithms, and Software [M]. New York: John Wiley and Sons, 1998.

    [13] [13] ZHANG S. Absolute phase retrieval methods for digital fringe projection profilometry: A review [J]. Optics and Lasers in Engineering, 2018, 107: 28-37.

    [18] [18] SCHARSTEIN D, SZELISKI R. High-accuracy stereo depth maps using structured light [C]//IEEE Computer Society Conference on Computer Vision and Pattern Recognition. Madison: IEEE, 2003: 195-202.

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    TAO Qian, ZHOU Zhi-feng, WU Ming-hui, WANG Li-rui. Detection of reflective surface defects based on phase measuring deflectometry[J]. Chinese Journal of Liquid Crystals and Displays, 2020, 35(12): 1315

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    Paper Information

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    Received: Jul. 23, 2020

    Accepted: --

    Published Online: Dec. 28, 2020

    The Author Email:

    DOI:10.37188/yjyxs20203512.1315

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