[1] [1] Reddy M, Peterson J M, Vang T, et al. Molecular Beam Epitaxy Growth of HgCdTe on Large-Area Si and CdZnTe Substrates [J]. Journal of Electronic Materials, 2011, 40(8): 17061716.

[2] [2] Cui X P, Fang W Z, Sun S W, et al. Characteristics of the Dislocations in CdZnTe Crystals Revealed by Etch Pits [J]. Journal of Crystal Growth, 2011, 321(1): 4044.

[3] [3] Sheng F F, Cui X P, Sun S W, et al. Etch Pits of Precipitates in CdZnTe Crystals on (111) B Surface [J]. Journal of Crystal Growth, 2012, 354(1): 7680.

[4] [4] Black D R, Long G G. X-Ray Topography [M]. Washington: U.S. Government Publishing Office, 2004.

[8] [8] Ivanitska V G, Moravec P, Franc J, et al. Chemical Etching of CdTe in Aqueous Solutions of H2O2-HI-Citric Acid [J]. Journal of Electronic Materials, 2007, 36(8): 18021808.