Acta Physica Sinica, Volume. 69, Issue 5, 054201-1(2020)
Fig. 1. Thickness gradient silver plated strip probe schematic and the magnified schematic diagram of the structure at the tip in the different planes.
Fig. 2. Structure of the three probes and light field distribution in the
Fig. 3. Peak electric field intensity distribution and normalized electric field intensity distribution curve along the probe centerline (
Fig. 4. Distribution of electric field intensity of three kinds of probes in
Fig. 5. The electric field strength at the tip of the thickness-graded silver-plated strip probe is distributed in the
Fig. 6. Surface current and tightly focused electric field intensity curves of the thickness-graded silver-plated strip probe structure corresponding to different
Emax/E0 and FWHM corresponding to different θ values.
不同θ值所对应的Emax/E0和FWHM
Emax/E0 and FWHM corresponding to different θ values.
不同θ值所对应的Emax/E0和FWHM
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Xiao-Lei Wang, Jie-Hui Zhao, Miao Li, Guang-Ke Jiang, Xiao-Xue Hu, Nan Zhang, Hong-Chen Zhai, Wei-Wei Liu.
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Received: Oct. 9, 2019
Accepted: --
Published Online: Nov. 18, 2020
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