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Opto-Electronic Engineering, Volume. 44, Issue 10, 1027(2017)

Measurement of Si―OH content in fused silica with extended dynamic range by Fourier transform infrared spectroscopy

Jiangning Zhou1 and Bincheng Li1,2
Author Affiliations
  • 1Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu 610209, China
  • 2School of Optoelectronic Information, University of Electronic and Science and Technology of China, Chengdu 610054, China
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    Jiangning Zhou, Bincheng Li. Measurement of Si―OH content in fused silica with extended dynamic range by Fourier transform infrared spectroscopy[J]. Opto-Electronic Engineering, 2017, 44(10): 1027

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    Paper Information

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    Received: --

    Accepted: --

    Published Online: Nov. 27, 2017

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    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology