Spectral-interferometry-based diff-iteration for high-precision micro-dispersion measurement

Wei Du; Jingsheng Huang; Yang Wang; Maozhong Zhao; Juan Li; Juntao He; Jindong Wang; Wenfu Zhang; Tao Zhu

doi:10.1364/PRJ.523314

Photonics Research, Volume. 12, Issue 6, 1362(2024)

Spectral-interferometry-based diff-iteration for high-precision micro-dispersion measurement

Wei Du^1、†, Jingsheng Huang^1、†, Yang Wang², Maozhong Zhao¹, Juan Li¹, Juntao He¹, Jindong Wang^1、*, Wenfu Zhang^2,3, and Tao Zhu^1,4

Author Affiliations

¹Key Laboratory of Optoelectronic Technology & System (Ministry of Education), Chongqing University, Chongqing 400044, China

²State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China

³e-mail: wfuzhang@opt.ac.cn

⁴e-mail: zhutao@cqu.edu.cn

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Wei Du, Jingsheng Huang, Yang Wang, Maozhong Zhao, Juan Li, Juntao He, Jindong Wang, Wenfu Zhang, Tao Zhu, "Spectral-interferometry-based diff-iteration for high-precision micro-dispersion measurement," Photonics Res. 12, 1362 (2024)

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Paper Information

Category: Instrumentation and Measurements

Received: Mar. 7, 2024

Accepted: Apr. 22, 2024

Published Online: May. 30, 2024

The Author Email: Jindong Wang (jdwang@cqu.edu.cn)

DOI:10.1364/PRJ.523314

CSTR:32188.14.PRJ.523314

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology