[2] [2] Heiken G，Vaniman D，French B. Lunar Sourcebook: A User’s Guide to the Moon [M]. Cambridge: Cambridge University Press，1991.

[4] [4] Elad M，Aharon M. Image denoising via sparse and redundant representations over learned dictionaries [J]. IEEE Trans. on Image Processing(S1057-7149)，2006，15(12): 3736-3745.

[5] [5] YANG Jian-chao，Wright J，MA Yi，et al. Image super-resolution as sparse representation of raw image patches [C]// IEEE Computer Vision and Pattern Recognition，Anchorage AK，USA，Jun 23-28，2008: 1-8.

[6] [6] YANG Jian-chao，Wright J，Huang T，et al. Image super-resolution via sparse representation [J]. IEEE Trans. on Image Processing(S1057-7149)，2010，19(11): 2861-2873.

[7] [7] Roman Z，Elad M，Protter M. On single image scale-up using sparse-representations [C]// Proceedings of the 7th international conference on Curves and Surfaces，Avignon，France，Jun 24-30，2010: 711-730.

[8] [8] Donoho D L. Compressed Sensing [J]. IEEE Trans. on Information Theory(S0018-9448)，2006，52(4): 1289-1306.

[9] [9] Aharon M，Elad M，Bruckstein A. The K-SVD: An algorithm for designing of over complete dictionaries for sparse representation [J]. IEEE Trans. on Signal Processing(S1053-587X)，2006，54(11): 4311-4322.

[10] [10] Needell D，Vershynin R. Signal Recovery From Incomplete and Inaccurate Measurements Via Regularized Orthogonal Matching Pursuit [J]. IEEE Journal of Signal Processing(S1932-4553)，2010，4(1): 310-316.

[11] [11] Bruckstein A，Donoho D L，Elad M. From Sparse Solutions of Systems of Equations to Sparse Modeling of Signals and Images [J]. SIAM Review(S1095-7200)，2009，51(1): 34-81.

[12] [12] Elad M. Sparse and Redundant Representations: From Theory to Applications in Signal and Image Processing [M]. Heidelberg: Springer，2010.

[13] [13] Schultz R R，Stevenson R L. A Bayesian Approach to Image Expansion for Improved Definition [J]. IEEE Transactions on Image Processing(S1057-7149)，1994，3(3): 233-242.

[14] [14] CHANG Hong，Yeung D Y，XIONG Yi-ming. Super-resolution through neighbor embedding [C]// IEEE Conference on Computer Vision and Pattern Classification，Washington DC，USA，Jun 27-Jul 2，2004: 275-282.