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Acta Optica Sinica, Volume. 11, Issue 4, 294(1991)

A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser

[in Chinese]1, [in Chinese]1, [in Chinese]2, and [in Chinese]2
Author Affiliations
  • 1Instrumentation Division, Brookhaven National Laboratory, Upton, NY.11973, U.S.A
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Novel Long-scanning Surface Instrument Design Using a Zeeman 2-f requency Laser[J]. Acta Optica Sinica, 1991, 11(4): 294

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 22, 1990

    Accepted: --

    Published Online: Nov. 12, 2007

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology