Journal of Inorganic Materials, Volume. 40, Issue 2, 196(2025)

Twinning Defects in Near-stoichiometric Lithium Niobate Single Crystals

Yongxin HAO1,2, Jun SUN3、*, Jinfeng YANG3, Chencheng ZHAO1,2, Ziqi LIU1,2, Qinglian LI1,2, and Jingjun XU1
Author Affiliations
  • 11. School of Physics, Nankai University, Tianjin 300071, China
  • 22. Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan 030006, China
  • 33. Research Center for Crystal Materials, Xinjiang Key Laboratory of Functional Crystal Materials, Xinjiang Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Urumqi 830011, China
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    Figures & Tables(14)
    Schematic diagram of sample locations for wafer Li content testing
    4-inch (100 nm) Z-cut LN wafers obtained from VTE experiments 1-6
    Schematic diagram of experimental device for the 4th VTE experiment
    6-inch (153 nm) Z-cut nSLN wafer obtained from the 7th VTE experiment (VTE-7)
    Transmission spectra of CLN wafer and nSLN wafers
    Birefringence changes in the twinning regions of wafers VTE-3-Z and VTE-3-X rotated at different angles within 180°
    Direction of the twinned lamella on the Z-cut wafer after VTE process
    X-ray diffraction pattern of the twinning plane within the wafer VTE-1-1
    Cracks at crossing of twins on Z-cut wafers before and after polishing
    Direction of the twinned lamella on the X-cut wafer after VTE process
    Slip of niobium atoms (or lithium atoms) during twinning deformation of LN crystal
    • Table 1. Results of crystals diffusion under different conditions

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      Table 1. Results of crystals diffusion under different conditions

      ExperimentSampleCrystalDiffusion treatment conditionResults
      OrientationSize/mmTemperature/℃Time/hWafer placement
      1VTE-1-1Z-cutϕ100×0.861100120HorizontalCracked, twins
      VTE-1-2
      2VTE-2-1Z-cutϕ100×0.861100120VerticalUncracked, twins
      VTE-2-2
      3VTE-3-ZZ-cutϕ100×1.021100300VerticalUncracked, twins
      VTE-3-XX-cutϕ76.2×0.50
      4VTE-4-1Z-cutϕ100×0.861100120VerticalUncracked, twins
      VTE-4-2
      5VTE-5-1Z-cutϕ100×0.861100120VerticalUncracked, twins
      VTE-5-2Uncracked, without twins
      6VTE-6-1Z-cutϕ100×0.861100120HorizontalUncracked, without twins
      VTE-6-2
      7VTE-7Z-cutϕ153×1.021100120HorizontalUncracked, without twins
    • Table 2. Curie temperatures (TC) and Li contents (CLi) of different wafers

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      Table 2. Curie temperatures (TC) and Li contents (CLi) of different wafers

      SampleTC/℃ Average of TC/℃ CLi/% (in mole)
      VTE-5-2112001200.249.94
      21201
      31200
      41201
      51199
      VTE-6-1112021201.649.98
      21201
      31202
      41201
      51202
      VTE-7112021201.049.96
      21201
      31200
      41201
      51201
    • Table 3. Angles between families of crystal planes and (0001) plane of LN crystal[22]

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      Table 3. Angles between families of crystal planes and (0001) plane of LN crystal[22]

      Family of LN crystal planesAngleFamily of LN crystal planesAngle
      {101¯0}90°{112¯0}90°
      {101¯1}72°10′{224¯3}74°26′
      {101¯4}37°52′{011¯2}57°15′
      {112¯3}60°53′{011¯8}21°14′
      {112¯6}41°55′{022¯1}80°52′
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    Yongxin HAO, Jun SUN, Jinfeng YANG, Chencheng ZHAO, Ziqi LIU, Qinglian LI, Jingjun XU. Twinning Defects in Near-stoichiometric Lithium Niobate Single Crystals[J]. Journal of Inorganic Materials, 2025, 40(2): 196

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    Paper Information

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    Received: Jul. 19, 2024

    Accepted: --

    Published Online: Apr. 24, 2025

    The Author Email: Jun SUN (sunjun@nankai.edu.cn)

    DOI:10.15541/jim20240343

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