Fig. 1. Typical function module of CCD imaging equipment

Fig. 2. Experimental setups of high-power microwave and double-exponential NEMP. (a) Experimental setup of high-power microwave; (b) experimental setup of double-exponential NEMP under exposure of whole system ; (c) experimental setup of double-exponential NEMP under isolated exposure of CCD camera

Fig. 3. Flow chart of effect probability-threshold test

Fig. 4. Comparison of two kinds of failure-probability

Fig. 5. (a) Schematic of single-frame image and (b) relative grayscale value curve of single-row pixels at incident of EMP

Fig. 6. Diagrams of (a) single-frame luminance distortion and (b) one-rank dimension compression

Fig. 7. Grayscale plot in time domain after two-rank dimension compression