[1] [1] J. Salvi, X. Armangue, and J. Batlle, Pattern Recogn. 35, 1617 (2002).

[2] [2] Z. Zhang, IEEE Trans. Pattern Anal. Mach. Intell. 22, 1330 (2000).

[3] [3] Z. Chen and P. Shi, Chin. Opt. Lett. 3, 69 (2005).

[4] [4] M. Fiala and C. Shu, Mach. Vis. Appl. 19, 209 (2008).

[5] [5] L. Zhang, J. Zhang, and Y. Hu, in Proceedings of International Conference on Information and Automation 352 (2009).

[6] [6] J. Heikkila and O. SilvCn, in Proceedings of IEEE Computer Society Conference on Computer Vision and Pattern Recognitions 1106 (1997).

[7] [7] W. Ma, Y. Zheng, and Y. Liu, Opt. Eng. 5, 053602 (2009).

[8] [8] F. Zhou and W. Zhang, Proc. SPIE 7129, 71290C (2008).

[9] [9] J. Kim, P. Gurdjos, and I. Kweon, IEEE Trans. Pattern Anal. Mach. Intell. 4, 637 (2005).

[10] [10] Z. Yang, F. Chen, J. Zhao, and H. Zhao, in Proceedings of the Third IEEE Conference on Industrial Electronics and Applications 2222 (2008).

[11] [11] X. Meng and Z. Hu, Pattern Recogn. 36, 1155 (2003).

[12] [12] C. Sun, X. Zhang, and Y. Qu, Chin. Opt. Lett. 3, 585 (2005).

[13] [13] H. Cui, W. Liao, X. Cheng, N. Dai, and T. Yuan, Chin. Opt. Lett. 8, 33 (2010).

[14] [14] I. Miyagawa, H. Arai, and H. Koike, IEEE Trans. Image Process. 6, 1528 (2010).

[15] [15] H. Richard and Z. Andrew, Multiple View Geometry in Computer Vision (Cambridge University Press, Cambridge, 2000).

[16] [16] J. Weng, P. Cohen, and M. Herniou, IEEE Trans. Pattern Anal. Mach. Intell. 10, 965 (1992).