Photonics Research, Volume. 12, Issue 1, 51(2024)
High-speed silicon photonic electro-optic Kerr modulation
Fig. 1. (a) Depiction of PN junction, (b) PIN with intrinsic region width
Fig. 2. (a) Schematic view of the experimental setup used to measure the EOM from the MZM. DC voltage is applied to both arms; RF is either applied in single-drive or push–pull configuration (EDFA, erbium-doped fiber amplifier). (b) Effective index variations measured in push–pull configuration versus the reverse DC bias for a fixed RF peak amplitude of 1.4 V, (c) versus the RF amplitude for three reverse DC biases.
Fig. 3. Dots and the lines represent, respectively, the measurements and the corresponding fit or simulations. (a) Optical MZM transfer function for three electrical spectral components excluding intrinsic losses with
Fig. 4. (a) Setup used to acquire eye diagrams (PPG, pulse pattern generator; DC, reverse DC bias; EDFA, erbium-doped fiber amplifier; DCA, digital communications analyzer). (b) Extinction ratio and signal-to-noise ratio at 10 Gbit/s by applying dual 4
Fig. 5. Optical eye diagram display from 1 mm long PIN3 modulator by applying dual 2
Fig. 6. Optical transmission of an unbalanced MZI for an applied reverse bias of 0 and 30 V.
Fig. 7. Measurements (dots) of
Fig. 8. Eye diagram, respectively, measured at 2, 10, 18, 30 V reverse DC bias at 10 Gbits/s using 4
Fig. 9. Optical eye diagram of 6 mm long PIN3 modulator measured at a data rate of (a) 32 Gbit/s and (b) 40 Gbit/s using 4
Fig. 10. Cross section of the fabricated device viewed with an SEM.
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Jonathan Peltier, Weiwei Zhang, Leopold Virot, Christian Lafforgue, Lucas Deniel, Delphine Marris-Morini, Guy Aubin, Farah Amar, Denh Tran, Xingzhao Yan, Callum G. Littlejohns, Carlos Alonso-Ramos, Ke Li, David J. Thomson, Graham Reed, Laurent Vivien, "High-speed silicon photonic electro-optic Kerr modulation," Photonics Res. 12, 51 (2024)
Category: Silicon Photonics
Received: Feb. 28, 2023
Accepted: Aug. 7, 2023
Published Online: Dec. 14, 2023
The Author Email: Jonathan Peltier (jonathan.peltier@c2n.upsaclay.fr), Weiwei Zhang (Weiwei.Zhang@soton.ac.uk)
CSTR:32188.14.PRJ.488867