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High Power Laser and Particle Beams, Volume. 34, Issue 9, 093002(2022)

Electric field probe calibration and improvement method based on open TEM cell

Haoyan Wang, Junna Li*, Yuhan Gong, and Jian Liu
Author Affiliations
  • Xi’an Jiaotong University, School of Electrical Engineering, Xi’an 710049
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    AbstractGet PDF(in Chinese)
    Figures&Tables (10)
    Equations (4)
    References (14)
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    Figures & Tables(10)
    Open TEM cell

    Fig. 1. Open TEM cell

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    Electric field waveforms at h=1 mm and h=148 mm when d=149 mm

    Fig. 2. Electric field waveforms at h=1 mm and h=148 mm when d=149 mm

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    S21 parameters and S11 parameters

    Fig. 3. S21 parameters and S11 parameters

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    Model with the probe

    Fig. 4. Model with the probe

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    Fitting curve of error withh

    Fig. 5. Fitting curve of error withh

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    TEM cell with improved structure

    Fig. 6. TEM cell with improved structure

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    S21 and S11 parameters of improved structure

    Fig. 7. S21 and S11 parameters of improved structure

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    • Table 1. Electric field distribution and error

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      Table 1. Electric field distribution and error

      measuring point/mm amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%
      d=149 mm d=199 mm d=249 mm d=299 mm
      (0,0, 1)688432.56515502.59412072.60343342.66
      (0,0, 40)681971.61513132.11410652.25341842.21
      (0,0, 80)669010.32506710.84408871.81340321.76
      (0,0, 120)657411.77499100.46402230.15337750.99
      (0,0, 160)——493181.86398910.67334010.12
      (0,0, 200)————395731.46330631.14
      (0,0, d-1) 655012.40491062.28391992.40326232.45

    • Table 2. Electric field distribution and error after the probe is placed

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      Table 2. Electric field distribution and error after the probe is placed

      insulation size measuring point/mm amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%
      d=149 mm d=199 mm d=249 mm d=299 mm
      l1=2 mm l2=18 mm (0,0, 1)7827516.63545258.51424495.70349734.57
      (0,0, 40)8081120.41549139.28425415.93350714.86
      (0,0, 80)8825131.495697513.38428176.61351215.01
      (0,0, 120)——6200223.384427010.23352755.47
      (0,0, 160)————4750918.30362828.48
      (0,0, 200)——————3913417.01
      (0,0, d−51) 8974433.726421027.785117427.424353630.17
      l1=10 mm l2=10 mm (0,0, 1)8104120.755580911.06430977.31351545.11
      (0,0, 40)8430125.615646912.37432137.60352845.50
      (0,0, 80)9323138.915945418.31437728.99354185.90
      (0,0, 120)——6623931.824594614.40357026.75
      (0,0, 160)————5100026.993705510.79
      (0,0, 200)——————4006219.78
      (0,0,d−51) 9502241.586914637.605553438.284598937.51

    • Table 3. Electric field distribution and error of improved structure

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      Table 3. Electric field distribution and error of improved structure

      measuring point/mm amplitude/(V·m−1) error/(%)amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%amplitude/(V·m−1) error/%
      d=149 mm d=199 mm d=249 mm d=299 mm
      (0,0, 1)688292.56516882.85412862.80345123.19
      (0,0, 40)683131.79513612.21411272.41342132.30
      (0,0, 80)670340.12507971.09408241.65340191.72
      (0,0, 120)658801.84500650.37403450.46337200.83
      (0,0, 160)——494051.68398710.72334380.02
      (0,0, 200)————395141.61331200.97
      (0,0, d−1) 655982.26492142.06393322.06327382.11
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    Haoyan Wang, Junna Li, Yuhan Gong, Jian Liu. Electric field probe calibration and improvement method based on open TEM cell[J]. High Power Laser and Particle Beams, 2022, 34(9): 093002

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    Paper Information

    Category: High Power Microwave Technology

    Received: Nov. 2, 2021

    Accepted: Dec. 30, 2021

    Published Online: Aug. 17, 2022

    The Author Email: Li Junna (uvlina@126.com)

    DOI:10.11884/HPLPB202234.210461

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology