An Automatic Test System for Optical Passive Device Performance

Caofan Jin; Xiang Zhang; Tao Chen; Yue Guo; Yanjing Wang

doi:10.3788/LOP57.132302

Laser & Optoelectronics Progress, Volume. 57, Issue 13, 132302(2020)

An Automatic Test System for Optical Passive Device Performance

Caofan Jin^*, Xiang Zhang, Tao Chen, Yue Guo, and Yanjing Wang

Shanghai Optical Transmission and Sensing Engineering Technology Research Center No.23 Research Institute, China Electronics Technology Group Corporation, Shanghai 201900, China

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Abstract Get PDF(in Chinese)

Figures & Tables(7)

Fig. 1. Schematic of DOP measurement

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Fig. 2. DS-DBR laser structure

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Fig. 3. System block diagram

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Fig. 4. Schematic of system program running process

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Table 1. Electrical and optical characteristics of photoelectric detector
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Table 1. Electrical and optical characteristics of photoelectric detector
Parameter Symbol Unit Value
Spectral range λ nm 800-1700
Dark current I_d(V_R=5 V) pA 5
Reverse breakdown voltage V_BR(I_R=10 μA) V 40
Response time T_r(R_L=50 Ω,V_R=5 V) ps 120
Band width(-3 dB) B_w(R_L=50 Ω,V_R=5 V) GHz 3

Table 2. WDL test data

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Table 2. WDL test data

Wavelength /nm	PM400K4 /dBm	WDL1 /dB	System /dBm	WDL2 /dB	Absolute error /dB
1530	-3.37	/	-3.35	/	0.02
1535	-3.39	/	-3.38	/	0.01
1540	-3.44	/	-3.44	/	0
1545	-3.47	/	-3.49	/	0.02
1550	-3.52	/	-3.55	/	0.03
1555	-3.55	/	-3.60	/	0.05
1560	-3.58	/	-3.62	/	0.04
1565	-3.62	/	-3.65	/	0.03
/	/	0.25	/	0.30	0.05

Table 3. PDL test data

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Table 3. PDL test data

DOP /%	PM400K4 /dBm	PDL1 /dB	System /dBm	PDL2 /dB	Absolute error /dB
0	-3.87	/	-3.90	/	0.03
10	-3.89	/	-3.93	/	0.04
20	-3.94	/	-3.97	/	0.03
30	-4.00	/	-4.02	/	0.02
40	-4.05	/	-4.08	/	0.03
50	-4.09	/	-4.11	/	0.02
60	-4.12	/	-4.16	/	0.04
70	-4.15	/	-4.20	/	0.05
80	-4.19	/	-4.23	/	0.04
90	-4.22	/	-4.27	/	0.05
100	-4.27	/	-4.32	/	0.05
/	/	0.40	/	0.42	0.02

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Caofan Jin, Xiang Zhang, Tao Chen, Yue Guo, Yanjing Wang. An Automatic Test System for Optical Passive Device Performance[J]. Laser & Optoelectronics Progress, 2020, 57(13): 132302

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