Chinese Optics Letters, Volume. 8, Issue s1, 105(2010)

Analysis of the magnitude and distribution of low loss thin film

Dandan Liu1, Huasong Liu1,2, Yiqin Ji1,3, Fuhao Jiang4, and Deying Chen3
Author Affiliations
  • 1Tianjin Key Laboratory of Optical Thin Films, Tianjin Jinhang Institute of Technical Physics, Tianjin 300192, China
  • 2Institute of Precision Optical Engineering, Tongji University, Shanghai 200192, China
  • 3National Key laboratory of Tunable Laser, Institute of Optical-Electronics, Harbin Institute of Technology, Harbin 150001, China
  • 4Beijing Institute of Automation Control Equipment, Beijing 100074, China
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    References(5)

    [1] [1] G. Rempe, R. J. Thompson, H. J. Kimble, and R. Lalezari, Opt. Lett. 17, 363 (1992).

    [2] [2] N. A. Robertson, K. A. Strain, and J. Hough, Opt. Commun. 69, 345 (1989).

    [3] [3] Y. Ji, Y. Cui, H. Liu, J. Zong, H. Song, W. Hong, F. Jiang, and C. Sun, Infrared Laser Engineering (in Chinese) 37, 505 (2008).

    [4] [4] H. E. Bennett and J. O. Porteus, J. Opt. Soc. Am. 51, 123 (1961).

    [5] [5] J. Wang, R. L. Maier, and J. H. Bruning, Proc. SPIE 5188, 106 (2003).

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    Dandan Liu, Huasong Liu, Yiqin Ji, Fuhao Jiang, Deying Chen, "Analysis of the magnitude and distribution of low loss thin film," Chin. Opt. Lett. 8, 105 (2010)

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    Paper Information

    Category: 3d holographic display

    Received: Dec. 8, 2009

    Accepted: --

    Published Online: May. 14, 2010

    The Author Email:

    DOI:10.3788/COL201008s1.0105

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