Photonics Insights, Volume. 3, Issue 2, R04(2024)
Advanced manufacturing of dielectric meta-devices
Fig. 1. The schematic diagram illustrates typical fabrication techniques for all-dielectric metasurfaces, categorized into four parts. The first part encompasses standard nanolithography (NL) methods, specifically EBL, FIB lithography, and laser-based nanomanufacturing. The second part shows advanced NL techniques, such as grayscale lithography and scanning probe lithography (SPL). The third part explores mass manufacturing technologies, including molecular self-assembly, DUV lithography, and nanoimprint lithography. The fourth part delves into extreme nanofabrication techniques tailored for high-aspect-ratio, slanted, flexible, and multilayer nanostructures, respectively.
Fig. 2. Comparison of the optical properties of different dielectric materials and their high-efficiency applications across the UV to IR spectrum.
Fig. 3. The illustration clarifies the pattern transfer through the lithography process. Following the exposure of the resist film to a specific radiation source (such as photons, electrons, or ions), the intended pattern is transferred to the resist film through the developer. Subsequently, the pattern is transposed onto the dielectric materials, encompassing two cases. In the first case, the pattern is transferred through etching techniques; after the etching process, the final step involves stripping the resist through chemical or physical methods. In the second case, the dielectric material is deposited into the exposed and developed areas, followed by the lift-off process.
Fig. 4. The utilization of EBL in the fabrication of all-dielectric metasurfaces. (a) The schematic depicts the fabrication process of silicon-based structural color utilizing EBL.[28] Initially, a PMMA resist film is spin-coated onto the silicon-coated sapphire substrate. Subsequently, the resist is exposed to an electron beam and developed to form PMMA nanostructures. The sample is then transferred to an E-beam evaporator and coated directly with Cr films. After a lift-off process involving immersion in acetone, the PMMA is removed, and the nanostructures are effectively transferred to Cr. The silicon is later etched away using reactive ion etching with
Fig. 5. The utilization of focused ion beam lithography in the fabrication of all-dielectric metasurfaces. (a) FIB gallium ion milling in a Gaussian profile for the direct fabrication of subwavelength nanoholes on silicon through scanning, enabling multicolor generation. The SEM image (right) displays the nanohole, with the corresponding enlarged cross-sectional view as an inset. SEM images (bottom) of color filter arrays, with the right corner in each image showing the cross-section SEM obtained by FIB cutting.[165] (b) Chiral visible light metasurface patterned in monocrystalline silicon on sapphire using FIB. The SEM image on the left includes FIB paths and directions (curved arrows), and the inset is a tilted SEM image. The right image presents a 3D model of a unit cell.[166] (c) All-dielectric phase-change reconfigurable metasurface consisting of a period grating fabricated by FIB milling in an amorphous
Fig. 6. The utilization of LIL in the fabrication of all-dielectric metasurfaces. (a) Schematic representation (top row) of the interference setup with two, three, four, and six overlapping beams, along with the corresponding light intensity patterns (bottom row)[198]. (b) Top-view SEM of polarization-independent two-dimensional diffraction metal–dielectric grating.[199] (c) SEM image (left) of the silicon nanohole array pattern on SOI substrate and the appearance (right) of large-area printed broadband membrane reflectors by LIL. The inset shows the enlarged SEM image.[200] (d) Mie-resonant silicon-based metasurfaces via single-pulse LIL: Schematic (left) illustrating the four-beam interference setup and the resulting intensity distribution. Mechanism of silicon transformation (middle) utilizing the interference intensity pattern. Top view (right) SEM images of nanoholes (intermediate state, a-Si) and nanoparticles (Mie resonator state, p-Si) patterned from the Si film, respectively. Scale bar = 1 µm.[93] (e) Metasurface-generated complex 3D optical fields for LIL: Concept (left) of a metamask generating specific diffraction orders to create a desired 3D pattern in the photoresist. Optical image (middle) of the fabricated optimized diamond metamask. Simulated and measured cross-sections (right) of the captured 3D intensity pattern under 514 nm laser illumination.[201]
Fig. 7. The utilization of LDW in the fabrication of all-dielectric metasurfaces. (a) The patterned pulse LDW approach for creating sub-wavelength features. The schematic illustration (top) shows the pulse LDW system, and the SEM image of fabricated H-shaped arrays with sub-wavelength feature size is visible. Scale
Fig. 8. The utilization of two-photon lithography in the fabrication of all-dielectric metasurfaces. (a) Dielectric metasurfaces in the optical diffraction with a fine structure: SEM images of fabricated dielectric particle/inverted counterpart structures and corresponding optical diffraction patterns.[209] (b) SEM images of the device for controlling 3D optical fields via inverse Mie scattering.[210] (c) SEM images of an inverse-designed near-infrared polarization beam splitter fabricated by two-photon LDW.[211] (d) SEM image of a two-photon LDW-printed hologram on the single-mode fiber facet (scale bar is 20 µm).[214] (e) Realization of a helix-based perfect absorber for IR spectral range using two-photon LDW: Fabrication process (left) of dielectric templates. Zoom-in SEM image (right) of a single-turn metallic helix.[216] (f) Inverse design and 3D printing of a metalens on an optical fiber tip for two-photon LDW: SEM image (left) of the fabricated metalens on top of the fiber. Schematic of the homebuilt two-photon polymerization setup (right). The inset shows the SEM image of the pattern “NU” produced by the metalens using the homemade setup.[215]
Fig. 9. The utilization of grayscale lithography in the fabrication of all-dielectric metasurfaces. (a) Grayscale lithography enables the creation of height-gradient-tunable nanostructure arrays, as illustrated in the schematic (top). This method utilizes grayscale EBL, ALD, and a transfer process for assembling nano-configurations with varying heights. The bottom row displays typical SEM images of
Fig. 10. The utilization of multistep lithography in the fabrication of all-dielectric metasurfaces. (a) A versatile metasurface with self-cleaning and dynamic color response, fabricated through EBL and laser lithography: Two super wettability states switchable with hydrophobic treatment or
Fig. 11. The utilization of scanning probe lithography in the fabrication of all-dielectric metasurfaces. (a) SPL for imaging and patterning applications.[239] (b) Nanopatterning achieved through combined thermal SPL and dry etching, along with corresponding SEM images of silicon fabrication using a
Fig. 12. The utilization of UV lithography in the fabrication of all-dielectric metasurfaces. (a) The schematic diagram illustrates the production of large-area metalenses utilizing photolithographic stepper technology. An accompanying photograph of the fabricated metalens (upper right) showcases a 2 cm diameter. A SEM image of the metalens center (center right) reveals the nanocylinder constituting the metalens. Scale bar: 2 µm.[267] (b) The fabrication process of wafer-scale membrane-based metasurfaces for mid-infrared photonics and biosensing. In the top right photograph, a fully processed 4 in. silicon wafer is depicted, showcasing large-area metasurfaces. The bottom right provides a high-magnification SEM image of the metasurface unit cell, revealing the thin
Fig. 13. The utilization of nanoimprint lithography in the fabrication of all-dielectric metasurfaces. (a) The fabrication process of an all-dielectric heterogeneous metasurface, designed as an efficient ultra-broadband reflector, is depicted on the left. The cross-sectional SEM image on the right provides a detailed view of the fabricated metasurface.[279] (b) Schematic representation of the fabrication process for silicon nanostructures with adjustable geometries through soft nanoimprint lithography and reactive ion etching (left). The initial imprinted SU8 nanostructure is presented in the first column before etching. The second column displays the results after well-controlled etching times, showcasing the tunable meta-atom geometries (right).[280] (c) Single-step manufacturing of hierarchical dielectric metalenses in the visible. SEM images depict the master mold, soft mold, and final plum pudding metalens, respectively. Scale bars: 1 µm. Scale bars of inset optical micrographs: 100 µm.[281] (d) The
Fig. 14. The utilization of self-assembly in the fabrication of all-dielectric metasurfaces. (a) Illustration of the primary fabrication steps for the flexible, all-dielectric metasurface utilizing nanosphere lithography. The accompanying images on the right showcase SEM images of self-assembled polystyrene (PS) spheres (top) and Si cylinders (bottom) formed after RIE. Scale bars: 1 µm.[285] (b) Illustration of the self-assembly-based nanosphere lithography technique for the large-scale fabrication of all-dielectric metasurface perfect reflectors, accompanied by a camera image depicting the pattern of PS spheres on an SOI substrate (left column). SEM images showcase PS spheres with a diameter initially at 820 nm and subsequently downscaled to 560 nm after etching (middle column). The top and tilted views exhibit the final metamaterial, comprising an array of Si cylinders. Scale bar: 2 µm.[98] (c) Image of large-scale metasurfaces created through grayscale nanosphere lithography. A grayscale pattern is produced by the DMD system utilizing a 365 nm I-line UV light source, transmitted through a projection system incorporating an objective lens. The schematic depicts the air–water interface for nanosphere self-assembly, while the SEM image showcases the close-packed nanosphere monolayer after self-assembly, with a scale bar of 5 µm. Additionally, an optical image of the fabricated metalens is presented. Scale bar: 200 µm.[232] (d) The left panel illustrates the schematic, while the right panel displays the SEM image of the self-assembly process of nanostructured glass metasurfaces through templated fluid instabilities. The fabrication initiates with thermal or ultraviolet nanoimprinting of the requisite pattern on a substrate, as shown in the top section (scale bar, 400 nm). Subsequently, a thin-film deposition of high-index optical glass is performed in the middle section (scale bar, 1 µm). The final step involves annealing to induce the dewetting process, depicted in the bottom section (scale bar, 1 µm). A schematic of the dewetting process is also provided. An optical photograph showcases a large area (
Fig. 15. Multilayer dielectric metasurface nanofabrication. (a) A depiction of the sequential steps involved in the fabrication of bilayer chiral silicon metasurfaces. The right image provides a perspective and an oblique-view SEM representation of the accomplished chiral metasurfaces.[303] (b) Bilayer metasurfaces for comprehensive light manipulation involve a meticulous fabrication process, as illustrated on the left. The SEM image on the right depicts the a-Si nanobrick array and the Ag nanobrick array, showcasing the intricate details. Scale bars: 1 µm.[103] (c) The fabrication process of multilayer non-interacting dielectric metasurfaces for multiwavelength meta-optics is depicted on the left. The inset displays an optical microscope image of the alignment marks from the two layers. Scale bar: 30 µm. An SEM image of silicon nano-posts before PDMS spin coating is presented on the right. Scale bar: 300 nm.[307] (d) The hybrid achromatic metalens, composed of a phase plate and nanopillar, is designed for broadband, near-infrared imaging and fabricated using two-photon lithography.[304] (e) Multilayer achromatic metalenses (MAMs) with high numerical aperture produced through 3D printing. The left image presents a tilted view of the fabricated multilayer achromatic metalenses, showcasing deconstructed MAMs with single, double, and triple (full) layers. The right SEM image offers an enlarged view of the full MAM and sectioned MAM.[305] (f) Inverse-designed multilayered metaoptics using 3D printing, implemented in a low-index polymer. The SEM of the measured sample is displayed in the right panel.[306]
Fig. 16. Flexible dielectric metasurface nanofabrication. (a) Stretchable all-dielectric metasurfaces with polarization-insensitive and full-spectrum response are depicted in this study. The sample fabrication process is schematically illustrated on the left. The middle graphic portrays the conceptual image of the stretchable
Fig. 17. Slanted dielectric metasurface nanofabrication. (a) Detection of intrinsic chiral bound states in the continuum (BICs). Schematic representation of the slant-perturbation metasurface designed to achieve intrinsic chiral BICs. Side-view (left) and cross-sectional (right) SEM images showcasing the fabricated metasurface. Scale bar: 300 nm. Reflection spectra measurements for two metasurface samples under LCP and RCP incidence, respectively (top right). Comparison of CDs and
Fig. 18. High-aspect-ratio dielectric metasurface nanofabrication. (a) The diagram illustrates the fabrication process of a high-efficiency broadband achromatic metalens designed for near-infrared biological imaging. A highly directional etching process is employed to create
Fig. 19. Advanced applications, such as imaging[12, 313
Fig. 20. Prospects for the bright future of all-dielectric metadevices/optics with wafer-scale mass fabrication, including (i) metalenses, (ii) AR and VR, (iii) optical sensors, (iv) color/holographic displays, (v) AI-based spectrometer/advanced imaging, (vi) telekinesis and telepathy, and (vii) satellite communications/LIDAR.
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Wenhong Yang, Junxiao Zhou, Din Ping Tsai, Shumin Xiao, "Advanced manufacturing of dielectric meta-devices," Photon. Insights 3, R04 (2024)
Category: Review Articles
Received: Apr. 26, 2024
Accepted: Jun. 11, 2024
Published Online: Jul. 2, 2024
The Author Email: Din Ping Tsai (dptsai@cityu.edu.hk), Shumin Xiao (shumin.xiao@hit.edu.cn)
CSTR:32396.14.PI.2024.R04