Chinese Journal of Lasers, Volume. 46, Issue 9, 903003(2019)
Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum
Fig. 1. SEM graphs of samples deposited under different distances from target to substrate when laser fluence is 4 J/cm2. (a) 3 cm; (b) 4 cm; (c) 5 cm; (d) 6 cm; (e) 7 cm
Fig. 2. XRD spectra of samples under different distances from target to substrate when laser fluence is 4 J/cm2
Fig. 3. SAED graph of sample when distance from target to substrate is 5 cm and laser fluence is 4 J/cm2
Fig. 4. SEM graphs of samples under different fluences when distance from target to substrate is 5 cm. (a) 3.1 J/cm2; (b) 3.5 J/cm2; (c) 3.9 J/cm2; (d) 4.3 J/cm2; (e) 4.7 J/cm2
Fig. 5. XRD spectra of samples under different fluences when distance from target to substrate is 5 cm
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Deng Zechao, Liu Jiandong, Wang Xu, Meng Xudong, Ding Xuecheng, Chu Lizhi, Wang Yinglong. Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum[J]. Chinese Journal of Lasers, 2019, 46(9): 903003
Category: materials and thin films
Received: Mar. 18, 2019
Accepted: --
Published Online: Sep. 10, 2019
The Author Email: Yinglong Wang (hdwangyl@hbu. cn)