Chinese Journal of Lasers, Volume. 46, Issue 9, 903003(2019)

Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum

Deng Zechao, Liu Jiandong, Wang Xu, Meng Xudong, Ding Xuecheng, Chu Lizhi, and Wang Yinglong*
Author Affiliations
  • College of Physics Science and Technology, Hebei University, Key Laboratory of Photo-Electronics Information Materials of Hebei Province, National-Local Joint Engineering Laboratory of New Energy Photoelectric Devices, Baoding, Hebei 071002, China
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    Figures & Tables(5)
    SEM graphs of samples deposited under different distances from target to substrate when laser fluence is 4 J/cm2. (a) 3 cm; (b) 4 cm; (c) 5 cm; (d) 6 cm; (e) 7 cm
    XRD spectra of samples under different distances from target to substrate when laser fluence is 4 J/cm2
    SAED graph of sample when distance from target to substrate is 5 cm and laser fluence is 4 J/cm2
    SEM graphs of samples under different fluences when distance from target to substrate is 5 cm. (a) 3.1 J/cm2; (b) 3.5 J/cm2; (c) 3.9 J/cm2; (d) 4.3 J/cm2; (e) 4.7 J/cm2
    XRD spectra of samples under different fluences when distance from target to substrate is 5 cm
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    Deng Zechao, Liu Jiandong, Wang Xu, Meng Xudong, Ding Xuecheng, Chu Lizhi, Wang Yinglong. Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum[J]. Chinese Journal of Lasers, 2019, 46(9): 903003

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    Paper Information

    Category: materials and thin films

    Received: Mar. 18, 2019

    Accepted: --

    Published Online: Sep. 10, 2019

    The Author Email: Yinglong Wang (hdwangyl@hbu. cn)

    DOI:10.3788/CJL201946.0903003

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