Chinese Journal of Lasers, Volume. 46, Issue 9, 903003(2019)
Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum
A silver (Ag) target was ablated using the XeCl excimer laser at room temperature in vacuum. Films were deposited on the Si(111) substrates parallel to the target surface. The scanning electron microscopy, X-ray diffraction (XRD), and selected area electron diffraction analysis results denote that the deposited films comprise Ag nanoparticles with different sizes. The fixed laser fluence increases the distance from the target to the substrate, decreases the nanoparticle size and depth of the film, and weakens the combinative extent of the nanoparticles. Further, the XRD spectrum intensity of the crystallographic face of (111) decreases, whereas that of the crystallographic face of (200) increases. When the distance from the target to the substrate is fixed, the nanoparticle size and depth of the film increases with the increasing laser fluence, and the combinative extent of the nanoparticles increases. The XRD spectrum intensity of the crystallographic face of (111) increases, whereas that of the crystallographic face of (200) barely decreases. Furthermore, the experimental results are analyzed on the basis of the nucleation and transition of the nanoparticles, mobility of the ablated particles, and surface energy required in film growth along different crystallographic faces.
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Deng Zechao, Liu Jiandong, Wang Xu, Meng Xudong, Ding Xuecheng, Chu Lizhi, Wang Yinglong. Growth Characteristics of Ag Nanocrystalline Thin Films Prepared by Pulsed Laser Ablation in Vacuum[J]. Chinese Journal of Lasers, 2019, 46(9): 903003
Category: materials and thin films
Received: Mar. 18, 2019
Accepted: --
Published Online: Sep. 10, 2019
The Author Email: Yinglong Wang (hdwangyl@hbu. cn)