Acta Optica Sinica, Volume. 40, Issue 19, 1914001(2020)

975 nm Semiconductor Lasers with Ultra-Low Internal Optical Loss

Yuxuan Man1,3, Li Zhong1、*, Xiaoyu Ma1,2, and Suping Liu1
Author Affiliations
  • 1National Engineering Research Center for Optoelectronic Devices, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2College of Materials Science and Optoelectronics, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(7)
    Refractive index and light field distribution of asymmetric large optical cavity
    Calculated hole density in asymmetric large optical cavity
    Schematic of energy band structure in thermal equilibrium
    Relationship between inverse external differential quantum efficiency and cavity length
    Curves of threshold current and threshold current density with cavity length
    Optical and electrical characteristics for 4 mm broad area lasers with 100 μm stripe width (insert is the spectrum at output power of 21 W)
    • Table 1. Doping concentration of each layer in epitaxial structure

      View table

      Table 1. Doping concentration of each layer in epitaxial structure

      Layer typeDoping /(1018 cm-3)
      ContactC: 100
      C: 10
      P-claddingC: 0.2
      C: 0.05
      WaveguideUndoped
      Quantum wellUndoped
      WaveguideUndoped
      Si: 0.01
      N-claddingSi: 0.07
      Si: 0.2
      Si:0.5
      Buffer1
      Substrate2
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    Yuxuan Man, Li Zhong, Xiaoyu Ma, Suping Liu. 975 nm Semiconductor Lasers with Ultra-Low Internal Optical Loss[J]. Acta Optica Sinica, 2020, 40(19): 1914001

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    Paper Information

    Category: Lasers and Laser Optics

    Received: Apr. 27, 2020

    Accepted: Jun. 11, 2020

    Published Online: Sep. 19, 2020

    The Author Email: Zhong Li (zhongli@semi.ac.cn)

    DOI:10.3788/AOS202040.1914001

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