Researching | A data processing method in Ritchey-Common test

Opto-Electronic Engineering, Volume. 31, Issue 1, 23(2004)

A data processing method in Ritchey-Common test

[in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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References(2)

[1] [1] HAN Sen,NOVAK Erik,SCHURING Mike.Application of Ritchey-Common test in large flat mearsurements [J]. SPIE, 2001,4399:131-136.

[2] [2] SHU K L.Ray-trace analysis and data reduction methods for the Ritchey-Common Test [J]. Applied Optics,1983,22(12):1879-1886.

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A data processing method in Ritchey-Common test[J]. Opto-Electronic Engineering, 2004, 31(1): 23

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Paper Information

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Received: Sep. 10, 2003

Accepted: --

Published Online: Nov. 14, 2007

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Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology