APPLIED LASER, Volume. 45, Issue 4, 40(2025)

Kerf Angle and Its Manipulation in Pico-Second Laser Cutting

Zhang Yinan
Author Affiliations
  • Shanghai JiWu Optoelectronic Technology Co, Ltd, Shanghai 201815, China
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    References(4)

    [1] [1] RAHIM K, MIAN A. A review on laser processing in electronic and MEMS packaging[J]. Journal of Electronic Packaging, 2017, 139(3): 030801.

    [2] [2] SCHULZ W, EPPELT U, POPRAWE R. Review on laser drilling I. Fundamentals, modeling, and simulation[J]. Journal of Laser Applications, 2013, 25(1): 012006.

    [3] [3] MINGAREEV I, FORNAROLI C, GILLNER A. Laser dicing of silicon and electronics substrates[M].Advances in laser materials processing. Amsterdam: Elsevier, 2018: 89-120.

    [14] [14] KUMAGAI M, UCHIYAMA N, OHMURA E, et al. Advanced dicing technology for semiconductor wafer—Stealth dicing[J]. IEEE Transactions on Semiconductor Manufacturing, 2007, 20(3): 259-265.

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    Zhang Yinan. Kerf Angle and Its Manipulation in Pico-Second Laser Cutting[J]. APPLIED LASER, 2025, 45(4): 40

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    Paper Information

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    Received: Mar. 3, 2024

    Accepted: Sep. 8, 2025

    Published Online: Sep. 8, 2025

    The Author Email:

    DOI:10.14128/j.cnki.al.20254504.040

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