Journal of Applied Optics, Volume. 45, Issue 3, 537(2024)
Measurement method of beam quality factor β for high energy laser
[2] WIDENHORN R. Influence of illumination on dark current in charge-coupled device imagers[J]. Journal of Electronic Imaging, 18, 033015(2009).
[3] KUMAR A, SARKAR S, AGARWAL R P. A novel algorithm and hardware implementation for correcting sensor non-uniformities in infrared focal plane array based staring system[J]. Infrared Physics & Technology, 50, 9-13(2007).
[4] SCRIBNER D A, SARKADY K A, KRUER M R et al. Adaptive nonuniformity correction for IR focal-plane arrays using neural networks[J]. SPDE-IntSoc for Opt Engineering, 100-109(1991).
[7] ZHOU Bingkun[M]. Laser principle, 84-96(2009).
[8] LI Junchang, XIONG Bingheng[M]. Theory and calculation of information optics, 49-63(2009).
[11] SU Yi, WAN Min[M]. High energy laser system, 39-59(2004).
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Wanhong YIN, Zaitian DONG, Yunlong ZHANG, Wentao WANG, Lei LIU, Haoyuan CHEN, Yuanyuan DUAN, Lei WU, Gaoping LI, Dongyu YU, Pei WU, Bing YU, Pengcheng SUN. Measurement method of beam quality factor β for high energy laser[J]. Journal of Applied Optics, 2024, 45(3): 537
Category: Research Articles
Received: Dec. 26, 2022
Accepted: --
Published Online: Jun. 2, 2024
The Author Email: Wanhong YIN (515070709@qq.com)