Journal of Applied Optics, Volume. 45, Issue 2, 422(2024)

Calibration method of topography error of white light interferometry on curved surface sample measurement

Heran LI1, Qun YUAN1、*, Xiaoxin FAN1, Jiale ZHANG1, Jianqiu MA1, Wenyou QIAO1, Zhishan GAO1, Zhenyan GUO1, Lihua LEI2, and Yunxia FU2
Author Affiliations
  • 1School of Electronic and Optical Engineering, Nanjing University of Science and Technology, Nanjing 210094, China
  • 2Jiangsu Institute of Measurement and Testing Technology, Nanjing 210023, China
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    Figures & Tables(14)
    Microsphere and its foil model
    NA cone limit of white light interferometer when measuring tilted surface
    Flow chart of virtual-measured inverse filtering correction method
    3D STF of virtual WLI white light interferometer
    Cross section of bandpass filter
    Interference fringes and signals at fringe center before and after bandpass filtering
    Foil model of microsphere (x−z cross section)
    Spectrum of foil model (kx−kz cross section)
    Measured STF of WLI (kx−kz cross section)
    Interference fringes after different inverse filtering correction and corresponding signals at center of fringe
    Interference signals corresponding to different surface slopes corrected by ordinary inverse filtering
    Interference signals corresponding to different surface slopes corrected by virtual-measured fusion inverse filtering
    Topography measurement results and errors corrected by different inverse filtering
    • Table 1. Comparison of results of two inverse filtering correction methods

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      Table 1. Comparison of results of two inverse filtering correction methods

      Calibration methodRMSE/μmLateral measuring range/μmMaximum measurable slope/(°)
      Uncalibrated0.545 570.498.09
      Ordinary inverse filtered0.336 3145.8716.93
      Virtual-measured inverse filtered0.175 9181.1421.20
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    Heran LI, Qun YUAN, Xiaoxin FAN, Jiale ZHANG, Jianqiu MA, Wenyou QIAO, Zhishan GAO, Zhenyan GUO, Lihua LEI, Yunxia FU. Calibration method of topography error of white light interferometry on curved surface sample measurement[J]. Journal of Applied Optics, 2024, 45(2): 422

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    Paper Information

    Category: Research Articles

    Received: Oct. 19, 2023

    Accepted: --

    Published Online: May. 28, 2024

    The Author Email: Qun YUAN (袁群(1986—))

    DOI:10.5768/JAO202445.0203004

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