Journal of Inorganic Materials, Volume. 40, Issue 7, 817(2025)
Figures & Tables(11)
![(a) Densification curve of ZrB2-HfSi2 ceramic; (b) Sintering temperature and relative density of other ZrB2 based ceramics[27-34]](/Images/icon/loading.gif){kind=icon}
3. (a) Microstructure and (b) partial enlarged microstructure of ZrB2-HfSi2 ceramic; (c) EDS results of ZrB2-HfSi2 ceramic; (d) Gibbs free energy of the reaction (6)
4. EBSD analysis diagrams of ZrB2-HfSi2 ceramic with core-rim structure
5. (a) STEM image and element distribution of ZrB2-HfSi2 ceramic; (b) Microstructure at the interface of core-rim structure and SAED patterns; (c) HRTEM images of the selected interface position in Fig. 5(b)
6. (a) Microstructure at the interface of (Zr,Hf)Si2/ (Zr,Hf)B2 and SAED patterns; (b) HRTEM images of the selected interface position in Fig. 6(a)
7. Formation mechanism diagram of core-rim structure interface in ZrB2-HfSi2
8. Process of microstructure evolution during the sintering of ZrB2-HfSi2 ceramic
9. (a) Load-displacement curves of ZrB2, (Zr,Hf)B2 and (Zr,Hf)Si2 in nano indentation experiment; (b) Hardnesses of ZrB2, (Zr,Hf)B2 and (Zr,Hf)Si2 in the microstructures
10. (a) Fracture microstructure of ZrB2-HfSi2 ceramics; (b) Cleavage platform of core-rim structure; (c) Enlarged drawing of fracture and (d) corresponding EDS element distributions
Table 1. Measured and theoretical values of the interplanar spacing and misfit ratio
View tableView in ArticleTable 1. Measured and theoretical values of the interplanar spacing and misfit ratio
Crystalline plane Plane spacing measured/ theoretical value Crystalline plane Plane spacing measured/ theoretical value Mismatch ratio measured/theoretical value Interface (1¯10¯1)ZrB2 0.213/0.216 nm (1¯10¯1)(Zr,Hf)B2 0.216/0.215 nm 1.4%/0.4% Common lattice interface (01¯1¯1)ZrB2 0.209/0.216 nm (01¯1¯1)(Zr,Hf)B2 0.213/0.215 nm 1.9%/0.4% Common lattice interface (01¯11)(Zr,Hf)B2 0.214/0.215 nm (0¯20)(Zr,Hf)Si2 0.730/0.734 nm 228.5%/243.4% Noncommon lattice interface (¯1102)(Zr,Hf)B2 0.146/0.148 nm (1¯1¯1)(Zr,Hf)Si2 0.260/0.258 nm 78.1%/74.3% Noncommon lattice interface
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Zhifan WEI, Guoqing CHEN, Yufei ZU, Yuan LIU, Minghao LI, Xuesong FU, Wenlong ZHOU.
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Received: Feb. 17, 2025
Accepted: --
Published Online: Sep. 3, 2025
The Author Email: Guoqing CHEN (gqchen@dlut.edu.cn)
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