Acta Physica Sinica, Volume. 68, Issue 23, 238502-1(2019)

Atmospheric neutron single event effect in 65 nm microcontroller units by using CSNS-BL09

Zhi-Liang Hu1,2,3, Wei-Tao Yang1, Yong-Hong Li1、*, Yang Li1, Chao-Hui He1, Song-Lin Wang2,3, Bin Zhou2,3, Quan-Zhi Yu2,4, Huan He1, Fei Xie1, Yu-Rong Bai1, and Tian-Jiao Liang2,3、*
Author Affiliations
  • 1School of Nuclear Science and Technology, Xi’an Jiaotong University, Xi’an 710049, China
  • 2Spallation Neutron Source Science Center, Dongguan 523803, China
  • 3Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 4Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • show less

    The 65 nm-microcontroller units (MCUs) are being widely used in critical terrestrial tests, and the risk from atmospheric neutron becomes more and more serious. The spallation neutron source contains broad energy spectrum, which is different from the mono-energetic neutron sources, and is the most ideal irradiation source for atmospheric neutron single event effect (SEE). Benefiting from China Spallation Neutron Source (CSNS), the atmospheric neutron SEE in 65 nm-MCUs is tested for the first time at the CSNS 9th beam line in China. The beam line is locatedin the 46° direction along the proton hitting the target, and the neutron spectrum is achieved to range from meV to 1.6 GeV. The test is conducted in two conditions in order to investigate the influence of thermal neutron. One is that the thermal neutrons are shielded with a 2-mm-thick cadmium slat at the beam ejection hole, and the other is not. The detected effects are single bit upset (SBU) events. 16 SBU events are detected when 5.3363 × 1017 protons hit the tungsten target without the thermal neutron, and 63 SBU events are recorded in the condition of 7.2131 × 1017 protons striking the target and thermal neutrons included. Comparing with the high energy neutron (>1 MeV), the SBU events caused by thermal neutron contribute about 65% of the number of total upset events. The test results preliminarily illustrate that the thermal neutrons dominate the 65 nm MCU reliability.


    Get Citation

    Copy Citation Text

    Zhi-Liang Hu, Wei-Tao Yang, Yong-Hong Li, Yang Li, Chao-Hui He, Song-Lin Wang, Bin Zhou, Quan-Zhi Yu, Huan He, Fei Xie, Yu-Rong Bai, Tian-Jiao Liang. Atmospheric neutron single event effect in 65 nm microcontroller units by using CSNS-BL09[J]. Acta Physica Sinica, 2019, 68(23): 238502-1

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Aug. 5, 2019

    Accepted: --

    Published Online: Sep. 17, 2020

    The Author Email: Liang Tian-Jiao (