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Acta Optica Sinica, Volume. 45, Issue 9, 0928002(2025)

Detection System for Pipeline Leakage Based on Semiconductor Laser with Optical Injection

Nian Fang* and Zuyi Wu
Author Affiliations
  • School of Communication and Information Engineering, Key Laboratory of Specialty Fiber Optics and Optical Access Networks, Joint International Research Laboratory of Specialty Fiber Optics and Advanced Communication, Shanghai University, Shanghai , 200444, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (12)
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    References (26)
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    Figures & Tables(12)
    Schematic diagram of the linear pipeline leakage detection system based on semiconductor laser with optical injection

    Fig. 1. Schematic diagram of the linear pipeline leakage detection system based on semiconductor laser with optical injection

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    Leakage detection signals under different states. (a) Period-one; (b) period-two; (c) chaos; (d) injection locking

    Fig. 2. Leakage detection signals under different states. (a) Period-one; (b) period-two; (c) chaos; (d) injection locking

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    Schematic diagram of simulated experiment setup of the leakage detection system

    Fig. 3. Schematic diagram of simulated experiment setup of the leakage detection system

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    Output spectra from the slave laser in different states. (a) Free-running; (b) injection locking

    Fig. 4. Output spectra from the slave laser in different states. (a) Free-running; (b) injection locking

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    Output signal from the system without leakage

    Fig. 5. Output signal from the system without leakage

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    Output signals of the system under different leakage positions. (a) 1885.9 m; (b) 2885.9 m; (c) 3885.9 m

    Fig. 6. Output signals of the system under different leakage positions. (a) 1885.9 m; (b) 2885.9 m; (c) 3885.9 m

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    Diagrams of EWT decomposition of an output signal

    Fig. 7. Diagrams of EWT decomposition of an output signal

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    Denoising effect of the output signal. (a) Before denoising; (b) after denoising

    Fig. 8. Denoising effect of the output signal. (a) Before denoising; (b) after denoising

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    Average absolute error and standard deviation of location results under different leakage positions

    Fig. 9. Average absolute error and standard deviation of location results under different leakage positions

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    • Table 1. Parameters of the slave laser

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      Table 1. Parameters of the slave laser

      ParameterValue
      Linewidth enhancement factor α3
      Differential gain coefficient g /（m3·s-1）8.4×10-13
      Carrier density at transparency N0 /m-31.4×1024
      Gain saturation coefficient ε2.5×10-23
      Driving current I /mA50
      Active layer volume V /m-32.5×10-16
      Charge of an electron q /C1.6×10-19
      Photon lifetime τp /ps1.927
      Carrier lifetime τs /ns2.04
      Laser internal cavity round-trip time τin /ps2

    • Table 2. Pearson correlation coefficients between the EWT components and the original signal

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      Table 2. Pearson correlation coefficients between the EWT components and the original signal

      Signal componentPearson correlation coefficient
      IMF 10.1550
      IMF 20.1198
      IMF 30.0910
      IMF 40.1425
      r0.9685

    • Table 3. Location results at different leakage positions

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      Table 3. Location results at different leakage positions

      Leakage position numberAverage time difference /μs

      Actual

      position /m

      		Measured position /mAbsolute location error /m

      Before

      denoising

      After

      denoising

      Before

      denoising

      After

      denoising

      Before

      denoising

      After

      denoising

      114.05013.3931330.81405.01339.374.28.5
      219.63418.9501885.91963.41895.077.59.1
      320.78320.0942000.02078.32009.478.39.4
      423.76323.0782300.82376.32307.875.57.0
      529.69828.9432885.92969.92894.383.998.4
      630.92330.0873000.03092.33008.792.38.7
      733.88033.1043300.83388.03310.487.29.6
      839.77938.9413885.93977.93894.192.08.2
      940.91740.0804000.04091.74008.091.78.0
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    Nian Fang, Zuyi Wu. Detection System for Pipeline Leakage Based on Semiconductor Laser with Optical Injection[J]. Acta Optica Sinica, 2025, 45(9): 0928002

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    Paper Information

    Category: Remote Sensing and Sensors

    Received: Jan. 13, 2025

    Accepted: Mar. 3, 2025

    Published Online: May. 16, 2025

    The Author Email: Nian Fang (nfang@shu.edu.cn)

    DOI:10.3788/AOS250486

    CSTR:32393.14.AOS250486

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology