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Microelectronics, Volume. 51, Issue 1, 121(2021)

Comparative Study on Total Dose Irradiation Characteristics of Deep Submicron CMOS Transistors

ZHONG Chonghui1 and YU Xiaoquan2
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    ZHONG Chonghui, YU Xiaoquan. Comparative Study on Total Dose Irradiation Characteristics of Deep Submicron CMOS Transistors[J]. Microelectronics, 2021, 51(1): 121

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    Received: Nov. 10, 2020

    Accepted: --

    Published Online: Mar. 11, 2022

    The Author Email:

    DOI:10.13911/j.cnki.1004-3365.2000522

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology