Fig. 1. Measurement of SE decay lifetime for embedded emitters in a 3D PC based on a confocal imaging system. (a) A 3D woodpile PC frame diagram. (b) A measurement in a local zone reflects FDOS. (c) Schematic of signals from two local zones gives out different SE decay lifetime values.

Fig. 2. (a) Transmission spectra of the woodpile PC in the Γ-X direction before and after the QD attachment and the emission spectrum of the attached QDs with an emission peak wavelength matching the stopgap of the PC in the Γ-X direction. The shadow zone indicates the calculated wavelength range of the Γ-X direction stopgap. (b) Lifetime ratio distribution of 22,300 positions in a unit cell.

Fig. 3. Simulation of random excitation focal spot position averaged lifetime value ratio to the overall averaged lifetime value with different measurement times. (a) A typical average lifetime value ratio change with measurement times. (b) Lifetime ratio distribution of 2 measurement times for 10,000 times simulation. (c) Lifetime ratio distribution of 100 measurement times for 10,000 times simulation. (d) Confident up and down limits corresponding to 95% confident level vary with the measurement times with random excitation focal spot positions.

Fig. 4. (a) Typical measured decay curves that are fitted with single exponential decay function for QDs in the PC and in the reference. (b) Distribution of the SE decay lifetime value for QDs inside the PC and in the reference.