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Infrared Technology, Volume. 43, Issue 11, 1089(2021)

Application of Improved Wavelet Threshold in Infrared Thermal Wave Nondestructive Testing

Lanlin ZOU* and Nianqiong LI
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    ZOU Lanlin, LI Nianqiong. Application of Improved Wavelet Threshold in Infrared Thermal Wave Nondestructive Testing[J]. Infrared Technology, 2021, 43(11): 1089

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    Paper Information

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    Received: May. 31, 2021

    Accepted: --

    Published Online: Dec. 25, 2021

    The Author Email: Lanlin ZOU (147461632@qq.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology