Acta Optica Sinica, Volume. 9, Issue 1, 75(1989)
A Method for multiple angle of incidence ellipsometic analysis in determination of double-layer optical thin film parameters
References(0)
Tools
Get Citation
Copy Citation Text
ZHANG RUIZI, LUO JINSHEN, CHEN MIQI. A Method for multiple angle of incidence ellipsometic analysis in determination of double-layer optical thin film parameters[J]. Acta Optica Sinica, 1989, 9(1): 75
Paper Information
© Copyright 2018-2021 | Chinese Laser Press.
All Rights Reserved 沪ICP备15018463号-20