Chinese Journal of Lasers, Volume. 37, Issue S1, 293(2010)

Research about the Direct Method and Indirect Method of the Size-of-Source Effect of Radiation Thermometers

Hao Xiaopeng1、*, Yuan Zundong1, and Zhao Wanjun2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(7)

    [1] [1] P. Bloembergen. On the correction for the size-of-source effect corrected by background radiation[C]. Proceedings of 7th International Symposium on Temperature and Thermal Measurements in Industry and Science, 1999, 607~612

    [2] [2] G. Machin, M. Ibrahim. Size of source effect and temperature uncertainty: Ⅰ-high temperature systems[C]. Proceedings of 7th International Symposium on Temperature and Thermal Measurements in Industry and Science, 1999, 681~686

    [3] [3] G. Machin, M. Ibrahim. Size of source effect and temperature uncertainty: Ⅱ -low temperature systems[C]. Proceedings of 7th International Symposium on Temperature and Thermal Measurements in Industry and Science, 1999, 687~692

    [4] [4] M. Bart, E. Ham, P. Saunders. A new method to determine the size-of-source effect[J]. Int.J. Thermophys., 2007, 28: 2111~2117

    [5] [5] H. Yoon, C. Gibson, V. Khromchenko et al.. SSE- and noise-optimized InGaAs radiation thermometer[J]. Int. J. Thermophys., 2007, 28: 2076~2086

    [6] [6] Zhao Qi, Yuan Zundong, Li Dajin et al.. A new direct current photoelectric temperature comparator for realization of the new ITS-90[J]. Acta Metrologia Sinica, 1990, 11(4): 241~247

    [7] [7] Yuan Zundong, Zhao Qi, Duan Yuning et al.. A new transfer standard photoelectric pyrometer[J]. Acta Metrologia Sinica, 2003, 24(4): 257~261

    CLP Journals

    [1] Yuan Zundong. A New Background Radiation-Balanced Model for the Size-of-Source Effect Measurement[J]. Acta Optica Sinica, 2011, 31(12): 1212002

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    Hao Xiaopeng, Yuan Zundong, Zhao Wanjun. Research about the Direct Method and Indirect Method of the Size-of-Source Effect of Radiation Thermometers[J]. Chinese Journal of Lasers, 2010, 37(S1): 293

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    Paper Information

    Category: Measurement and metrology

    Received: Apr. 16, 2010

    Accepted: --

    Published Online: Oct. 29, 2010

    The Author Email: Xiaopeng Hao (haoxp@nim.ac.cn)

    DOI:10.3788/cjl201037s1.0293

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