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Acta Optica Sinica, Volume. 37, Issue 9, 0920001(2017)

Ray-Tracing Algorithm of Elliptical Reflection Zone Plate

Zuhua Yang*, Lai Wei, Qiangqiang Zhang, Yong Chen, Quanping Fan, Yinzhong Wu, and Leifeng Cao
Author Affiliations
  • Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    Figures&Tables (6)
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    Figures & Tables(6)
    Schematic for focusing and spectral analysis principle of off-axis ERZP

    Fig. 1. Schematic for focusing and spectral analysis principle of off-axis ERZP

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    Schematic of conical diffraction of gratings

    Fig. 2. Schematic of conical diffraction of gratings

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    Schematic of structural parameters of ERZP

    Fig. 3. Schematic of structural parameters of ERZP

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    Local micro-structure of off-axis ERZP

    Fig. 4. Local micro-structure of off-axis ERZP

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    Focusing properties on image plane under different light sources. (a) Ideal point source; (b) light source with finite dimension

    Fig. 5. Focusing properties on image plane under different light sources. (a) Ideal point source; (b) light source with finite dimension

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    Simulated results of two groups of polychromatic light sources. (a) 525, 524, 523 eV; (b) 524.5, 524, 523.5 eV

    Fig. 6. Simulated results of two groups of polychromatic light sources. (a) 525, 524, 523 eV; (b) 524.5, 524, 523.5 eV

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    Zuhua Yang, Lai Wei, Qiangqiang Zhang, Yong Chen, Quanping Fan, Yinzhong Wu, Leifeng Cao. Ray-Tracing Algorithm of Elliptical Reflection Zone Plate[J]. Acta Optica Sinica, 2017, 37(9): 0920001

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    Paper Information

    Category: Optics in Computing

    Received: Feb. 7, 2017

    Accepted: --

    Published Online: Sep. 7, 2018

    The Author Email: Yang Zuhua (20063274@cqu.edu.cn)

    DOI:10.3788/AOS201737.0920001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology