Acta Optica Sinica, Volume. 19, Issue 11, 1518(1999)

Nonlinear Excess Fraction Method and its Applications to Profilometry

[in Chinese], [in Chinese], and [in Chinese]
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    References(7)

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    CLP Journals

    [1] Shao Shuangyun, Xu Nan. Optical Three-dimensional Profilometry Based on Modulation Ratio[J]. Chinese Journal of Lasers, 2009, 36(2): 435

    [2] Dou Yunfu, Su Xianyu, Chen Yanfei. A Fast Modulation Measurement Profilometry[J]. Acta Optica Sinica, 2009, 29(7): 1858

    [3] Zhang Haihua, Li Yong, Lu Shijiang, Chen Liangfeng. Subpixel Matching of Three-Dimansional Imaging System Using Binary Spatiotemporal Encoded Illumination[J]. Chinese Journal of Lasers, 2011, 38(10): 1008006

    [4] Li Yong, Chen Yunfu, Jin Hongzhen, Wang Hui. Binary Spatio-Temporal Encoded Illumination for 3D Imaging[J]. Acta Optica Sinica, 2009, 29(3): 670

    [5] HAO Yi-ming, SU Xian-yu, ZHAO Yong, XIANG Li-qun. A New Method for the Binary Code Design and the Absolute Photoelectric Position Measurement[J]. Opto-Electronic Engineering, 2010, 37(11): 91

    [6] Lu Mingteng, Su Xianyu, Cao Yiping, You Zhisheng, Jing Hailong. A Method of Both Height Mapping and Camera Calibration at the Same Time in Modulation Measuring Profilometry[J]. Acta Optica Sinica, 2016, 36(6): 612002

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    [in Chinese], [in Chinese], [in Chinese]. Nonlinear Excess Fraction Method and its Applications to Profilometry[J]. Acta Optica Sinica, 1999, 19(11): 1518

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 21, 1998

    Accepted: --

    Published Online: Aug. 9, 2006

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