Optoelectronic Technology, Volume. 44, Issue 2, 106(2024)
Reliability Study and Lifetime Prediction of AlGaN‑based Deep Ultraviolet LED
Fig. 4. Optical power of LEDs with different Al-component QB structures before and after aging
Fig. 5. Normalised optical power with time curves of LEDs with different Al-component QB structures
Fig. 6. Optical power of LEDs with different Al-component EBL structures before and after aging
Fig. 7. Normalised optical power with time curves of LEDs with different Al-component EBL structures
Fig. 8. Optical power of LEDs before and after aging of different table surface areas
Fig. 9. Normalised optical power with time curves of LEDs with different table surface areas
Fig. 10. Variation curvesoptical power and normalised optical power with aging time under different aging temperatures of LED
Fig. 11. Electroluminescence spectra before and after aging at different temperatures (40 mA test) of 60 ℃ and 85 ℃constant temperature aging,respectively
Fig. 12.
Fig. 13.
Fig. 14. Variation curves of optical power and normalised optical power with aging time under different aging currents of LEDs
Fig. 15. Electroluminescence spectra before and after aging for different currents (40 mA test) of 40 mA,120 mA and 160 mA,respectively
Fig. 16.
Fig. 17.
Fig. 18. The curves fitted to the variation of normalised optical power with time for different aging temperatures
Fig. 19. The curves fitted to the variation of normalised optical power with time for different aging currents
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Mingfeng GONG, Xuejiao SUN, Cheng LEI, Ting LIANG, Fengchao LI, Yu XIE, Kaixin LI, Naixin LIU. Reliability Study and Lifetime Prediction of AlGaN‑based Deep Ultraviolet LED[J]. Optoelectronic Technology, 2024, 44(2): 106
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Received: Apr. 11, 2024
Accepted: --
Published Online: Jul. 19, 2024
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