Optoelectronic Technology, Volume. 44, Issue 2, 106(2024)

Reliability Study and Lifetime Prediction of AlGaN‑based Deep Ultraviolet LED

Mingfeng GONG1, Xuejiao SUN2, Cheng LEI1, Ting LIANG1, Fengchao LI1, Yu XIE1, Kaixin LI3, and Naixin LIU2,3
Author Affiliations
  • 1State Key Laboratory of Dynamic Measurement Technology,North University of China,Taiyuan Shanxi 03005,CHN
  • 2Institute of Semiconductors,Chinese Academy of Sciences,Beijing 100083,CHN
  • 3Shanxi Zhongke Lu'an Ultraviolet Optoelectronics Technology Co. Ltd,Changzhi Shanxi 046000,CHN
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    Figures & Tables(19)
    Epitaxial structure of deep ultraviolet LED
    Physical picture of the chip
    Physical photo of aging test samples
    Optical power of LEDs with different Al-component QB structures before and after aging
    Normalised optical power with time curves of LEDs with different Al-component QB structures
    Optical power of LEDs with different Al-component EBL structures before and after aging
    Normalised optical power with time curves of LEDs with different Al-component EBL structures
    Optical power of LEDs before and after aging of different table surface areas
    Normalised optical power with time curves of LEDs with different table surface areas
    Variation curvesoptical power and normalised optical power with aging time under different aging temperatures of LED
    Electroluminescence spectra before and after aging at different temperatures (40 mA test) of 60 ℃ and 85 ℃constant temperature aging,respectively
    I‑V curves (semi-logarithmic coordinates) before and after aging at different temperatures of 60 ℃ and 85 ℃ constant temperature aging,respectively
    I‑V curves (linear coordinates) before and after aging at different temperatures of 60 ℃and 85 ℃constant temperature aging,respectively
    Variation curves of optical power and normalised optical power with aging time under different aging currents of LEDs
    Electroluminescence spectra before and after aging for different currents (40 mA test) of 40 mA,120 mA and 160 mA,respectively
    I‑V curves (semi-logarithmic coordinates) before and after aging with different currents of 40 mA,120 mA and 160 mA,respectively
    I‑V curves (linear coordinates) before and after aging with different currents of 40 mA,120 mA and 160 mA,respectively
    The curves fitted to the variation of normalised optical power with time for different aging temperatures
    The curves fitted to the variation of normalised optical power with time for different aging currents
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    Mingfeng GONG, Xuejiao SUN, Cheng LEI, Ting LIANG, Fengchao LI, Yu XIE, Kaixin LI, Naixin LIU. Reliability Study and Lifetime Prediction of AlGaN‑based Deep Ultraviolet LED[J]. Optoelectronic Technology, 2024, 44(2): 106

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    Paper Information

    Category:

    Received: Apr. 11, 2024

    Accepted: --

    Published Online: Jul. 19, 2024

    The Author Email:

    DOI:10.12450/j.gdzjs.202402005

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