Fig. 1. Optical path schematic of detection system

Fig. 2. Propagation diagrams of Eout(x,y). (a) Divergent wave; (b) convergent wave

Fig. 3. (a) Distribution of original phase retardation δ(x,y); (b) distribution of azimuthal angle β(x,y);(c) distribution of emergent light; (d) distribution of focusing strength; (e) phase distribution of the intensity difference between owe-focus and off-focus

Fig. 4. (a) TIE retrieval phase map; (b) comparison between retrieval phase and original phase delay in the direction of red dotted line in Fig. 4 (a); (c) comparison between retrieval phase and original phase delay in the direction of yellow dotted line in Fig. 4 (a)

Fig. 5. (a) Intensity map in on-focus position after polarizer rotating π/4; (b) two different polarization directions integrated intensity map in on-focus position; (c) phase delay map calculated by the combined intensity map; (d) comparison between the calculated phase delay with the original phase delay information

Fig. 6. TIE retrieval phase maps of samples under microscope with linear polarization. (a) Focus intensity maps; (b) stress birefringence measurement results

Fig. 7. Intensity maps and retrieval phase maps. (a) Intensity maps after polarizer rotating π/4; (b) two different polarization directions integrated intensity maps; (c) TIE retrieval phase maps