Optics and Precision Engineering, Volume. 30, Issue 13, 1631(2022)

Defect detection in ceramic substrate based on improved YOLOV4

Feng GUO1, Qibing ZHU1、*, Min HUANG1, and Xiaoxiang XU2
Author Affiliations
  • 1Key Laboratory of Advanced Process Control for Light Industry, Ministry of Education, Jiangnan University, Wuxi2422, China
  • 2Wuxi CK Electric Control Equipment Co., Ltd, Wuxi14400, China
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    Feng GUO, Qibing ZHU, Min HUANG, Xiaoxiang XU. Defect detection in ceramic substrate based on improved YOLOV4[J]. Optics and Precision Engineering, 2022, 30(13): 1631

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    Paper Information

    Category: Information Sciences

    Received: Mar. 4, 2022

    Accepted: --

    Published Online: Jul. 27, 2022

    The Author Email: Qibing ZHU (zhuqib@163.com)

    DOI:10.37188/OPE.20223013.1631

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