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OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 19, Issue 2, 64(2021)

A Stress Birefringence Measurement Method Based on Photoelastic Modulator

ZHANG Wei1、*, YANG Lin2, and LIU Can3
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  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    [10] [10] Wong C F. Birefringence measurement using a photoelastic modulator［J］. Applied Optics， 1979， 18(23)： 3996-3999.

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    ZHANG Wei, YANG Lin, LIU Can. A Stress Birefringence Measurement Method Based on Photoelastic Modulator[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2021, 19(2): 64

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    Paper Information

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    Received: Nov. 2, 2020

    Accepted: --

    Published Online: Aug. 23, 2021

    The Author Email: ZHANG Wei (1148073029@qq.com)

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology